Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000

Sutton, Michael A.; Li, N.; Garcia, David; Cornille, Nicolas; Orteu, Jean-José; McNeill, Stephen R.; Schreier, Hubert W.; Li, Xiaojian; Reynolds, Anthony P.

doi:10.1007/s11340-007-9041-0

Cited by 185 publications

(131 citation statements)

References 13 publications

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“…The difference in the measured strain values is related to the errors associated with the DIC and the microgrid techniques. These are: a) the uncertainty in pinpointing the deformed grids intersections to measure the strain distribution, E G , b) errors due to beam shift in electron microscopy [28,29], E B and c) the errors associated with the correlation algorithms in DIC [34].…”

Section: Discussionmentioning

confidence: 99%

“…8 shows the resulting strain map with a maximum absolute strain value of 0.004, which is negligible compared to the strain values recorded during the test. This is likely to be due to the magnification selected to record the images, which is relatively low (about 500X) as the lower the magnification, the smaller the beam shift and consequently the smaller the error in strain measurement [28,29]. Fig.…”

Section: Discussionmentioning

confidence: 99%

“…Even though some work has been done to assess the accuracy of the measured displacement field with the DIC technique [18,[28][29][30], no quantitative analysis has been done in the case of very large local deformation to the authors' knowledge.…”

Section: Introductionmentioning

confidence: 99%

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Quantitative Strain Analysis of the Large Deformation at the Scale of Microstructure: Comparison between Digital Image Correlation and Microgrid Techniques

2012

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A comparative study has been carried out to assess the accuracy of the Digital Image Correlation (DIC) technique for the quantification of large strains in the microstructure of a Interstitial Free (IF) steel used in automotive applications. A microgrid technique has been used in this study in order to validate independently the strain measurements obtained with DIC. Microgrids with a pitch of 5 microns were printed on the etched microstructure of the IF steel to measure the local in-plane strain distribution during a tensile test carried out in a Scanning Electron Microscope (SEM). The progressive deformation of the microstructure with microgrids has been recorded throughout the test as a sequence of micrographs and subsequently processed using DIC to quantify the distribution of local strain values. Strain maps obtained with the two techniques have been compared in order to assess the accuracy of the DIC measurements obtained using the natural patterns of the revealed microstructure in the SEM micrographs. Although results obtained with the two techniques are qualitatively similar, therefore demonstrating the reliability of DIC applied to microstructures, even after large deformations in excess of 0.7. However, an average error of about 16% was found in the strain values calculated using DIC.

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Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

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Quantitative Strain Analysis of the Large Deformation at the Scale of Microstructure: Comparison between Digital Image Correlation and Microgrid Techniques

2012

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“…The map also shows a linear pattern which highlights a second type of error corresponding to the drift of the SEM electron beam during irradiation. Errors due to electron beam shift [34,35] are included in the overall values shown in Fig. 6(b) but they have been shown to be very small in magnitude, up to 0.4 %, as reported in [36], using Digital Image Correlation for strain analysis and the SEM used in this study.…”

Section: Results and Analysismentioning

confidence: 93%

New Experimental Procedure for the Analysis of Micro-Scale Surface Damage at High Temperature

2016

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A new experimental procedure has been developed to study micro-crack formation at the surface of compression specimens deformed at high temperature under thermomechanical conditions representative of hot forming operations for steels. Damage formation in a Fe-30wt%Ni alloy has been studied in relation to strain distributions measured at the scale of the microstructure using a microgrid technique. 20 μm-pitch microgrids have been deposited at the surface of a tapered specimen designed to generate critical levels of stress triaxiality representative to those leading to edge cracking in hot rolled steel products. The specimen was deformed using a revised plane strain compression test carried out under vacuum in a Gleeble machine at 1000°C. The grid distortion after the test has then been analysed to produce strain distribution maps which show local strain values ranging from 0 to 75 % for an applied compression of 25 %. Strain localisation has been commonly observed along grain boundaries where damage is initiated at high temperature. Results therefore provide new insight into the early stages of damage formation at the surface of hot rolled products.

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“…Most of these works address the calibration of the projection and the distortion, and has very little to do with the calibration of drift. According to Cornille (2005) and Sutton et al (2006Sutton et al ( , 2007 the pixel drift is estimated by the disparity between pairs of points and is fitted by B-splines w.r.t time. This model is used to estimate the drift and to remove it in real time.…”

Section: Related Workmentioning

confidence: 99%

Toward Fast Calibration of Global Drift in Scanning Electron Microscopes with Respect to Time and Magnification

Malti

Dembélé

Piat

et al. 2012

International Journal of Optomechatronics

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It is a well-known fact that scanning electron microscopic (SEM) image acquisition is mainly affected by nonlinearities and instabilities of the column and probe-specimen interaction; in turn, producing a shift in the image points with respect to many parameters and time, in particular. Even though this drift is comparatively less in modern SEMs, it is still an important factor to consider in most of the SEM-based applications. In this airticle, a simple and real-time method is proposed to estimate the global drift from a set of target images using image phase correlation, and to model its evolution by using the recursive equations of time and magnification. Based on the developed model, it is opted to use a Kalman filter in real time for accurate estimation and removal of the drift from the images. The developed method is tested using the images from a tungsten filament gun SEM (Jeol JSM 820) and a field effect gun SEM (FEI Quanta 200). The derived results show the effectiveness of the developed algorithm and also demonstrates its ability to be used in robotics as well as in material characterization under SEM.

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Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000

Cited by 185 publications

References 13 publications

Quantitative Strain Analysis of the Large Deformation at the Scale of Microstructure: Comparison between Digital Image Correlation and Microgrid Techniques

Quantitative Strain Analysis of the Large Deformation at the Scale of Microstructure: Comparison between Digital Image Correlation and Microgrid Techniques

New Experimental Procedure for the Analysis of Micro-Scale Surface Damage at High Temperature

Toward Fast Calibration of Global Drift in Scanning Electron Microscopes with Respect to Time and Magnification

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