Scanning Electron Microscopy for Fungal Sample Examination

Bioaccumulation and effects of lanthanum on growth and mitotic index in soybean plants

“…To analyze La cytolocalization in the roots and leaves, samples were prepared for scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDS) using the protocol proposed by Alves et al (2012), with slight modifications. Root and leaf fragments were collected from each plant and subsequently immersed in a fixing solution (Karnovsky solution modified with 7.2 pH 0.1 M potassium phosphate buffer) for 24 h. The samples were then transferred to a cryoprotectant solution (30% glycerol) for 30 min.…”

“…Root and leaf samples were fixed and analyzed in a transmission electron microscope (TEM), as described by Alves et al (2012). Briefly, the samples were fixed for 24 h at 4°C in 2.5% (v/v) glutaraldehyde in 0.1 M phosphate buffer solution (pH 7.3) and postfixed in 1% (w/v) aqueous osmium tetroxide for 3 h. Samples were dehydrated in a 50-100% ethanol series and finally embedded in Spurr resin.…”

Optimization of Laccase Production by Locally Isolated Trichoderma muroiana IS1037 Using Rubber Wood Dust as Substrate

“…Then they were coated with gold/palladium. The morphology of the fungus was detected using scanning electron microscopy (SEM) (JEOL JSM-6400, USA) (Alves et al 2012).…”

Impact of infrared treatment on quality and fungal decontamination of mung bean (Vigna radiata L.) inoculated with Aspergillus spp

“…Samples of untreated and IR-treated fungal spores were prepared as described previously. 17 Fifty microliters of spore suspension was adhered to the poly-L-lysine-coated glass slides. After 10 min, spores were fixed in 100 L fixative solution in the refrigerator for 24 h and washed with cacodylate buffer three times for 10 min each, followed by post-fixation in 1% osmium tetroxide for 2 h at room temperature.…”