1998
DOI: 10.1149/1.1838417
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Scanning Electrochemical Microscopy with Simultaneous Independent Topography

Abstract: A new method to perform scanning electrochemical microscopy (SECM) and topography simultaneously is described here. The new method uses a conventional scanning microelectrode to sense species released by local electrochemical reactions on the surface of a sample, combined with shear-force feedback to maintain the probe at a constant distance from the surface of the material. By using shearforce feedback, larger electrochemical currents can be detected at the microelectrode because the probe is scanned at a clo… Show more

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Cited by 112 publications
(72 citation statements)
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“…It can hence detect complete diffusion profiles in the surroundings of sources or sinks of redox-active species (Nebel et al 2010). In particular, coupling SECM with scanning probe techniques, such as atomic force microscopy (AFM) (Macpherson et al 1996) and scanning ion conductance microscopy (SICM) (Comstock et al 2010), shear force (Ludwig et al 1995;Ballesteros Katemann et al 2003b;James et al 1998;Ballesteros Katemann et al 2003a) and impedance-based techniques, (Alpuche-Aviles, Wipf 2001) as well as led to efficient strategies to control the tip-to-sample separation. In the combined technique of AFM-SECM, AFM tip is used as a working electrode and as the force sensor at the same time (Eckhard et al 2007;Kranz, Wiedemair 2008).…”
Section: Positioning Of the Probe Electrodementioning
confidence: 99%
“…It can hence detect complete diffusion profiles in the surroundings of sources or sinks of redox-active species (Nebel et al 2010). In particular, coupling SECM with scanning probe techniques, such as atomic force microscopy (AFM) (Macpherson et al 1996) and scanning ion conductance microscopy (SICM) (Comstock et al 2010), shear force (Ludwig et al 1995;Ballesteros Katemann et al 2003b;James et al 1998;Ballesteros Katemann et al 2003a) and impedance-based techniques, (Alpuche-Aviles, Wipf 2001) as well as led to efficient strategies to control the tip-to-sample separation. In the combined technique of AFM-SECM, AFM tip is used as a working electrode and as the force sensor at the same time (Eckhard et al 2007;Kranz, Wiedemair 2008).…”
Section: Positioning Of the Probe Electrodementioning
confidence: 99%
“…An alternative method combining the shear force mode based on a tuning fork technique with SECM for current independent positioning of ber-shaped electrodes has been described in the literature. [91][92][93][94] In these contributions, the SECM tip is attached to a tuning fork resonance detection system of a commercially available NSOM. The UME is attached to the leg of a tuning fork driven by a piezoelectric tube.…”
Section: Positioning Of Electrochemical Microbiosensors With the Use mentioning
confidence: 99%
“…Shear force control for SECM (SF‐SECM) is one of the technologies that has been proposed for positioning a microelectrode at a defined distance from a sample independently from the electrochemical measurement . Determination of local pH changes in shear force‐based SECM have been performed either with iridium oxide based pH‐sensor or membrane‐based ion‐selective electrodes .…”
Section: Introductionmentioning
confidence: 99%