Sapphire hard X-ray Fabry–Perot resonators for synchrotron experiments

Tsai, Yi-Wei; Wu, Yu‐Feng; Chang, Ying Yi; Liu, Wen‐Chung; Liu, Hong Lin; Chu, Chia Hung; Chen, Pei Chi; Lin, Pao Te; Fu, Chien Chung; Chang, Shih Lin

doi:10.1107/s1600577516004999

Cited by 4 publications

(2 citation statements)

References 16 publications

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“…In addition to single crystal polycrystals affecting the uniformity of sapphire, the growth method of the sapphire also affects the uniformity. Tsai et al [23] found that optical-grade sapphire grown by the heat exchange method (HEM) had a much lower dislocation density than sapphire grown by the Kylopoulos method (KYM).…”

Section: Materials Selection Considerationmentioning

confidence: 99%

Feasibility Analysis of Sapphire Compound Refractive Lenses for Advanced X-Ray Light Sources

Wang

Dong

2022

Front. Phys.

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The compound refractive lens (CRL) is a commonly used X-ray optical component for photon beam conditioning and focusing on the beamlines of the X-ray facilities. The normal preparation materials are beryllium, aluminum, silicon of current lenses, and they all suffered from high heat load fatigue and short pulse damage risks. Hard materials based CRL is engaged attention for the advanced X-ray application. Sapphire crystal has the advantages of high density, high melting point, low thermal expansion coefficient. In this paper, properties of the refraction and absorption ratio of Sapphire and parameters of Sapphire lenses of effective aperture, transmittance, resolution, number of lenses needed for a certain focus, are taken into account for the CRL design, comparing with those of several common materials as well. The calculation results show that the performance of the sapphire lens is better than that of the aluminum lens and silicon lens, and inferior to that of the beryllium lens and diamond lens, but the number of lenses used is less. In the meantime, performances of sapphire lenses focusing are simulated and thermal effects on lenses are analyzed. Analysis and discussion are carried out under the same conditions as the metal Aluminum ones. The focusing simulation shows that the sapphire lenses can obtain a smaller spot with more intensity. The thermal analysis indicates that the temperature during use of the sapphire lens is much lower than the melting point of sapphire, and the thermal deformation is negligible.

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Section: Materials Selection Considerationmentioning

confidence: 99%

Feasibility Analysis of Sapphire Compound Refractive Lenses for Advanced X-Ray Light Sources

Wang

Dong

2022

Front. Phys.

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“…Consider the well-known technique of normal-incidence hard X-ray Bragg reflection [14]- [18] which is utilized in, for example, simple two-crystal plate cavity [19]- [24], as well as in multi-cavity [25] [26] Fabry-Perot (FP) resonators when the magnitude of Bragg angle B θ is close to 90˚. The cavities are separated by the crystal plates with specific thickness ratios and, basically, have a common monolithic crystal base.…”

Section: Introductionmentioning

confidence: 99%

Planar Retro-Reflector for Grazing Incident Beam of High-Energy X-Ray Photons

Bezirganyan¹,

Bezirganyan²,

Bezirganyan³

2016

JAMP

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The grazing-incidence hard X-ray retro-reflector (GIRR) is a novel optical element, which completely suppresses the conventional mirror beam in the retro-reflection mode, and, at the same time, totally reflects the primary grazing incident X-radiation backwards to its source in strictly anti-parallel direction with minimal scattering. The GIRR is a good alternative to hard X-ray normal-incidence Bragg mirror, and has a high potential for applications in various X-ray optical devices and techniques, such as, hard X-ray optical noise (or background) filters, high-quality hard X-ray waveguides, low-gain hard X-ray free electron laser resonators (XFELRs), X-ray holography, coherent X-ray diffraction imaging, phase-contrast imaging, as well as in hard X-ray optical data storage devices and deep space hard X-ray communications. The proposed optical element consists of single-crystal wafer covered by a thin, non-diffracting layer of low-absorbing material.

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Investigation of dynamical X-ray back diffraction at grazing incidence

Chen,

Soo,

Lin

et al. 2023

Opt. Express

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We report a theoretical investigation of X-ray back diffraction at grazing incidence. Based on the framework of the dynamical theory of X-ray diffraction, the grazing incidence for Si (12 4 0) back diffraction is taken as an example to resolve the eigenvalue problem inside the crystal. The dispersion surface and the resulting diffraction intensities are strongly affected by the miscut angle as well as the diffraction geometry of grazing incidence. The kinematical relationship between the incident angle and the miscut angle is well explained by Snell’s law. While only the two-beam diffraction is considered, our treatment can be further extended to include the cases for multiple diffractions as well.

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Sapphire hard X-ray Fabry–Perot resonators for synchrotron experiments

Cited by 4 publications

References 16 publications

Feasibility Analysis of Sapphire Compound Refractive Lenses for Advanced X-Ray Light Sources

Feasibility Analysis of Sapphire Compound Refractive Lenses for Advanced X-Ray Light Sources

Planar Retro-Reflector for Grazing Incident Beam of High-Energy X-Ray Photons

Investigation of dynamical X-ray back diffraction at grazing incidence

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