2003
DOI: 10.1016/s0166-526x(03)41029-5
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Sample preparation for semiconductor materials

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Cited by 3 publications
(4 citation statements)
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“…On the other hand, the measurements of 39 K + and 40 Ca + subject to spectral interferences by 38 Ar 1 H + and 40 Ar + , respectively, which could be improved by using a cool plasma condition to reduce the ionization of argon and hydrogen. 19 Therefore, the dependence of the signal intensities in the standard and that in the blank solvent on the RF power was investigated to obtain the optimum operating condition for Na, K, and Ca measurements. …”
Section: Optimization Of Plasma Power For the Measurement Of Na And Kmentioning
confidence: 99%
“…On the other hand, the measurements of 39 K + and 40 Ca + subject to spectral interferences by 38 Ar 1 H + and 40 Ar + , respectively, which could be improved by using a cool plasma condition to reduce the ionization of argon and hydrogen. 19 Therefore, the dependence of the signal intensities in the standard and that in the blank solvent on the RF power was investigated to obtain the optimum operating condition for Na, K, and Ca measurements. …”
Section: Optimization Of Plasma Power For the Measurement Of Na And Kmentioning
confidence: 99%
“…Returning to the subject of using reaction/collisional chemistry with ICP-MS, this technology has also been applied to measuring the radioisotopes 90 Sr, 135 Cs, 137 Cs, 210 Pb and 226 Ra. 131 By optimising the collision cell parameters, an improvement in sensitivity for all these radioisotopes was achieved.…”
Section: Inorganic Chemicals and Acidsmentioning
confidence: 99%
“…This was a consequence of isobaric interference from the nonradioactive 135 Ba and 90 Zr isotopes. The method provided detection limits that were improved by a factor of 100, 33, 22, 500 and 50 for 90Sr, 135 Cs, 137 Cs, 210 Pb and 226 Ra, respectively, compared with non-reaction cell measurements of these isotopes.…”
Section: Inorganic Chemicals and Acidsmentioning
confidence: 99%
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