Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy

Hu, Xiukun; Dai, Gaoliang; Sievers, S.; Scarioni, Alexander Fernández; Corte‐León, Héctor; Puttock, Robert; Barton, Christopher; Kazakova, Olga; Ulvr, Michal; Klapetek, Petr; Havlíček, Marek; Nečas, David; Tang, Yuanjun; Neu, V.; Schumacher, H. W.

doi:10.1016/j.jmmm.2020.166947

Cited by 15 publications

(27 citation statements)

References 32 publications

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“…Figure 3b shows the simulated domain transition together with = tanh . The excellent agreement justifies to introduce domain walls based on a Bloch wall domain kernel [Appendix D] as discussed in [21].…”

Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 88%

“…The different approaches and characterization routes that will be used are summarized in the validation flow diagram (Figure 2). We start with the topmost branch, the micromagnetic simulations, and progress with qMFM based on a calibration using a pre-existing Co/Pt multilayer reference sample [16,21] in the following depicted as 'ref'. The characterizations culminate in a cross validation, where the pre-existing Co/Pt reference sample is characterized by qMFM calibrated using the Ti/Pt/Co sample.…”

Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 99%

“…These comparisons are depicted in Figure 2 1. The MFM measurements were performed with a Nanoscope IIIa with a Dimension head using a NT-MDT Low Moment MFM tip, following the procedure discussed in [21]. The measurement heights were = 64 nm and = 64 nm for calibration and validation measurements, respectively, with a pixel size of = 10 × 10 nm on a 512 × 512 spatial pixel grid.…”

Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 99%

“…The quality factor = 250 was determined by fitting the resonance curve of the tip with a Lorentzian function. The full width of the resonance curve at 0.707 of the maximum was used as the [21]. The cantilever stiffness c = 3 N/m was provided by the manufacturer.…”

Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 99%

“…To this end, up-and down-magnetized areas of the sample are identified by a discrimination based on a threshold criterion resulting in a binary matrix (1, -1). This is followed by a convolution with a domain wall operator [20,21] to introduce domain wall transitions, resulting in the normalized magnetization distribution ( ) in real, or ( ) in Fourier space. From the latter, can be calculated by using the relation [13]:…”

Section: Introductionmentioning

confidence: 99%

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A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

Sakar¹,

Sievers²,

Scarioni³

et al. 2021

Preprint

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Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack which shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process combined with a characterization of the sample micromagnetic parameters allows to reliably calculate the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

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Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 88%

Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 99%

Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 99%

Section: B)) a Self-correlation-based Analysis [Appendix B] Gives An Average Domain Width Ofmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

Sakar¹,

Sievers²,

Scarioni³

et al. 2021

Preprint

Self Cite

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show abstract

Mapping the magnetic field of skyrmions and spin spirals by scanning probe microscopy

Hug

2021

Magnetic Skyrmions and Their Applications

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Effect of a pulsed magnetic field on the tribological properties of amorphous/nanocrystalline composite coatings by supersonic plasma spraying

Wang

Huang²,

Zhang

et al. 2022

Applied Surface Science

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Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy

Cited by 15 publications

References 32 publications

A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

Mapping the magnetic field of skyrmions and spin spirals by scanning probe microscopy

Effect of a pulsed magnetic field on the tribological properties of amorphous/nanocrystalline composite coatings by supersonic plasma spraying

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