2018
DOI: 10.1063/1.5052193
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Room temperature spin injection into SiC via Schottky barrier

Abstract: Electrical spin injection into and spin extraction from a wide-bandgap semiconductor SiC at room temperature were demonstrated via Schottky junctions. The spin relaxation time of SiC could reach 300 ps, overwhelming that of Si with similar carrier density due to the smaller atomic number. We also found that there existed two channels in SiC/CoFeB Schottky junctions for spin relaxation, one from bulk SiC and the other from interfacial defect states within the barrier whose spin relaxation times were about 1 ns.… Show more

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Cited by 8 publications
(18 citation statements)
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“…An obvious change in signal amplitude and FWHM should have been observed if spins were captured by those localized states. [ 33,38 ] Careful measurements with different amplitudes of AC were conducted. Figure 3b shows the Hanle signals with various biases at 35 K. Characterized by the FWHM, τ s shows weak dependence on bias.…”
Section: Resultsmentioning
confidence: 99%
“…An obvious change in signal amplitude and FWHM should have been observed if spins were captured by those localized states. [ 33,38 ] Careful measurements with different amplitudes of AC were conducted. Figure 3b shows the Hanle signals with various biases at 35 K. Characterized by the FWHM, τ s shows weak dependence on bias.…”
Section: Resultsmentioning
confidence: 99%
“…) where E b is the tunneling barrier. 13,25 It turns out that AT 2 could be regarded as T-insensitive near room temperature 13 compared with the exponential term. Under this approximation, ln(I s ) has a linear dependence on 1/T.…”
Section: Resultsmentioning
confidence: 99%
“…Considering multistep sequential tunnelling process inside Schottky barrier region via the localized interfacial states as reported in ref. 13, the effective s s extracted from Hanle measurement should be actually an averaged spin relaxation time s int of the localized interfacial states and s bulk of the bulk. 13,16 Fortunately, s s is close to s int under low negative bias voltages and becomes closer to s bulk under higher negative bias voltages due to different tunnelling channels under different bias conditions.…”
Section: Resultsmentioning
confidence: 99%
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