2019
DOI: 10.1007/s11082-019-2076-5
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Role of oxygen concentrations on structural and optical properties of RF magnetron sputtered ZnO thin films

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Cited by 8 publications
(5 citation statements)
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“…This is likely because, at low RF plasma power, some of the zinc atoms can be masked by the incoming species before being oxidized. These results are in excellent agreement with those of El-Hossary et al and Otieno et al. , Otieno et al, in turn, stated that an increasing stoichiometry, Zn/O ratio, leads to an increase in the strain and the dislocation density of the ZnO films. These outcomes are also consistent with the field emission scanning electron microscopy images since the RF plasma power affects the morphology of the ZnO films.…”
Section: Resultssupporting
confidence: 91%
“…This is likely because, at low RF plasma power, some of the zinc atoms can be masked by the incoming species before being oxidized. These results are in excellent agreement with those of El-Hossary et al and Otieno et al. , Otieno et al, in turn, stated that an increasing stoichiometry, Zn/O ratio, leads to an increase in the strain and the dislocation density of the ZnO films. These outcomes are also consistent with the field emission scanning electron microscopy images since the RF plasma power affects the morphology of the ZnO films.…”
Section: Resultssupporting
confidence: 91%
“…The sharp and well-defined peaks of (002) are observed in all AZO samples. The (002) plane of AZO films corresponds to a diffraction angle value of 2θ ~ 34°, showing the hexagonal structure of wurtzite and the high intensity growth orientation along the c-axis direction as the oxygen content progressively rises (Hwang et al, 2011;Otieno et al, 2019) (see Fig. 1b).…”
Section: Resultsmentioning
confidence: 99%
“…In order to deposit stoichiometric films, it is necessary to optimize sufficient amount of oxygen with argon in the sputtering system. Accordingly, the obtained films were deposited with argon (Ar) at a flow rate of 30 sccm and oxygen (O 2 ) at 99.999 purity and 0.5 sccm as sputtering and reactive gases to suppress the oxygen vacancies that act as annihilators of holes during film deposition according to Otieno et al [25]. The RF power used was 200 W. The depositions were performed with a RF magnetron sputtering PlasmalabSystem400 (Oxford Instruments, Abingdon, UK).…”
Section: Ca-doped Zno:al Thin Film Synthesismentioning
confidence: 99%