2000
DOI: 10.1109/3.890284
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Role of nonradiative recombination in the degradation of InGaAsP/InP-based bulk lasers

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Cited by 15 publications
(10 citation statements)
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“…Concerning the increase of the the saturation current, it has been shown that an increase of the current for a given voltage can be explained by a decrease in carrier lifetime, which can be due to the introduction of non radiative recombination centres [16,19].…”
Section: Discussionmentioning
confidence: 98%
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“…Concerning the increase of the the saturation current, it has been shown that an increase of the current for a given voltage can be explained by a decrease in carrier lifetime, which can be due to the introduction of non radiative recombination centres [16,19].…”
Section: Discussionmentioning
confidence: 98%
“…This increase is coherent with the diode laser electrical properties theory. From literature [19,20], we expect irradiation induced non radiative recombination centers to result in an increase in the non-radiative current contribution and therefore in a drift of the ideality factor towards 2. It is interesting to note that no annealing effect is observed on this parameter.…”
Section: B Optical Propertiesmentioning
confidence: 97%
“…The sudden failure-mode could result from catastrophic, optical mirror-damage (COMD) [19] or a material-defect related failure, e.g. dark-line defect growth, inside the bulk of the material [20]. COMD is generally considered to be the major failure mode limiting the lifetime of AlGaAs/GaAs-based high power lasers [14].…”
Section: Device Reliabilitymentioning
confidence: 99%
“…The wear-out failure-mode occurs for lasers made in all material systems, e.g. AlGaAs/GaAs, InGaAsP/InP and AlGaInAs/InP, mainly due to enhanced, non-radiative recombination during aging [17,18]. The sudden failure-mode could result from catastrophic, optical mirror-damage (COMD) [19] or a material-defect related failure, e.g.…”
Section: Device Reliabilitymentioning
confidence: 99%
“…The wear-out degradation occurs for all the material systems such as AlGaAs/GaAs, InGaAsP/InP and AlGaInAs/InP, mainly due to enhanced nonradiative recombination taking place during the aging [15,19,20]. The sudden failure could result from catastrophic optical mirror damage (COMD) [21] or a defect-related failure (such as dark line damage) inside the bulk of the material [22]. The COMD is well-known as the most important effect limiting the lifetime of AlGaAs/GaAs-based high power lasers [21].…”
Section: Device Reliabilitymentioning
confidence: 99%