2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) 2015
DOI: 10.1109/emccompo.2015.7358338
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Role of IC substrate and ESD protections in noise propagation: Design and modelling of dedicated test chip in 40 nm technology

Mario Rotigni
1
,
Mauro Merlo
2
,
Martina Cordoni
3
et al.
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Conducted emissions in a 40 nm CMOS test chip: The role of the ESD protections

Rotigni
1
,
Merlo
2
,
Cordoni
3
et al. 2017
2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo)
1
0
2
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Conducted emissions in a 40 nm CMOS test chip: The role of the ESD protections

Rotigni
1
,
Merlo
2
,
Cordoni
3
et al. 2017
2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo)
1
0
2
0
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Effects of the On-Die Decoupling Capacitors on the EME Performance in 28 nm FD-SOI Technology

Rotigni
1
,
Merlo
2
,
Sanna
3
et al. 2019
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
3
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