“…This causes the crystallization of the amorphous network through the formation of a flexible network, when there is a sufficient amount of atomic hydrogen in the subsurface region, without significant removal of Si atoms. 24,25) There have been many arguments in support of each model, however, one model alone does not sufficiently explain all the phenomena in the formation process of cSi:H. 25) Recently, more microscopic observations have been reported using in-situ diagnostic techniques, 26) and a detailed mechanism underlying the formation process of c-Si:H has been proposed. Figure 12 shows the surface-roughness evolution during film growth revealed by spectroscopic ellipsometry (SE) for three hydrogen-dilution ratios R of 0, 10, and 20.…”