2016
DOI: 10.1134/s1063782616060191
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Role of electrostatic fluctuations in doped semiconductors upon the transition from band to hopping conduction (by the example of p-Ge:Ga)

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Cited by 16 publications
(30 citation statements)
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“…In this work in the weak electric field limit (e d k T B E  , where d is the mean hop length of electron via localized states) and when the thermal energy is greater than the fluctuation dispersion of energy levels of localized states it is shown that the ratio of the diffusion coefficient to the drift mobility is equal to k T e B . Finally, the values of effective hole or electron concentrations involved in hopping migration via hydrogenlike impurities in crystalline semiconductors are determined in [13,16,17,[28][29][30]. [31][32][33][34] used particular forms of the expressions for N hp and N hn that are only suitable for limiting values of the compensation ratio (K 1  or K 1 1 - ) of the majority impurity by the minority impurity.…”
Section: At Temperatures T T Jmentioning
confidence: 99%
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“…In this work in the weak electric field limit (e d k T B E  , where d is the mean hop length of electron via localized states) and when the thermal energy is greater than the fluctuation dispersion of energy levels of localized states it is shown that the ratio of the diffusion coefficient to the drift mobility is equal to k T e B . Finally, the values of effective hole or electron concentrations involved in hopping migration via hydrogenlike impurities in crystalline semiconductors are determined in [13,16,17,[28][29][30]. [31][32][33][34] used particular forms of the expressions for N hp and N hn that are only suitable for limiting values of the compensation ratio (K 1  or K 1 1 - ) of the majority impurity by the minority impurity.…”
Section: At Temperatures T T Jmentioning
confidence: 99%
“…The average concentration of the acceptors in the charge state (−1), taking into account deviations of their energy levels E a from the average value E 0 a > , can be written as [30]:…”
Section: Statistics Of Holes In Valence and Acceptor Bandsmentioning
confidence: 99%
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