2020
DOI: 10.1088/1361-6528/abc286
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Role of defects and grain boundaries in the thermal response of wafer-scale hBN films

Abstract: With more widespread applications of nanotechnology, heat dissipation in nanoscale devices is becoming a critical issue. We study the thermal response of wafer-scale hexagonal boron nitride (hBN) layers, which find potential applications as ideal substrates in two dimensional devices. Sapphire-supported thin hBN films, 2′′ in size and of different thicknesses, were grown using metalorganic vapour phase epitaxy. These large-scale films exhibit wrinkles defects and grain boundaries over their entire area. The sh… Show more

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Cited by 8 publications
(15 citation statements)
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“…This additional effect does not allow for reliable parameters modeling because of an unknown temperature-dependent behaviour of defects. It is suggested that the defect contribution should be linear [28]. Adding a further linear or quadratic term to the model would strongly influence other parameters which at this point are in good agreement with the literature values.…”
Section: Resultssupporting
confidence: 81%
See 1 more Smart Citation
“…This additional effect does not allow for reliable parameters modeling because of an unknown temperature-dependent behaviour of defects. It is suggested that the defect contribution should be linear [28]. Adding a further linear or quadratic term to the model would strongly influence other parameters which at this point are in good agreement with the literature values.…”
Section: Resultssupporting
confidence: 81%
“…The peak position at about 1367 cm −1 corresponds to the E 1u phonon mode of sp 2 hybridized boron nitride [26]. The high quality is manifested by the values of the γ BN parameter for the E 1u mode, which are relatively small compared to the values reported for epitaxial layers [18,[27][28][29]. The inset in FIG.…”
Section: Characterization Methodsmentioning
confidence: 88%
“…The peak position at about 1367 cm −1 corresponds to the E 1u phonon mode of sp 2 hybridized boron nitride [26]. The high quality of our epitaxial samples is manifested by the values of the γ BN parameter for the E 1u mode, which are similar to the values of the Raman E 2g peak width for high-quality epitaxial layers reported by other groups [18,[27][28][29]. The IR-active mode is nearly degenerated with the E 2g Raman-active mode and decays with the same channels [30].…”
Section: Characterization Methodssupporting
confidence: 83%
“…Since the phonon energy is a good indicator for strain [28], we investigated as-grown and delaminated samples. Due to the delamination process, both samples should exhibit different layer-substrate interactions.…”
Section: Resultsmentioning
confidence: 99%
“…From the position of the E 2g mode and its FWHM obtained by fitting the Lorentzian function, conclusions can be drawn about the quality and strain in the examined material [29]. The lower the value of the FWHM, the lower the concentration of defects in the boron nitride structure.…”
Section: Raman Measurements For Two-stage Samples With Off-cutmentioning
confidence: 99%