Robust error-management and impact of throughput in solid state storage — Characterization and first system reliability model

Sarkar, Jay; Peterson, Carl R.; Zhang, Yao; Lock, Steve

doi:10.1109/ram.2017.7889748

2017 Annual Reliability and Maintainability Symposium (RAMS) 2017

DOI: 10.1109/ram.2017.7889748

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Robust error-management and impact of throughput in solid state storage — Characterization and first system reliability model

Jay Sarkar

Carl R. Peterson

Yao Zhang

et al.

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Cited by 3 publications

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Enabling Prognostics of Robust Design with Interpretable Machine Learning

Sarkar

Peterson

2019

2019 IEEE International Electron Devices Meeting (IEDM)

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Robust error-management and impact of throughput in solid state storage — Characterization and first system reliability model

Cited by 3 publications

References 6 publications

Enabling Prognostics of Robust Design with Interpretable Machine Learning

Enabling Prognostics of Robust Design with Interpretable Machine Learning

Machine-learned assessment and prediction of robust solid state storage system reliability physics

Operational Workload Impact on Robust Solid-State Storage Analyzed with Interpretable Machine Learning

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