Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection

Saikiran, Marampally; Ganji, Mona; Chen, Degang

doi:10.1109/iscas48785.2022.9937644

Cited by 7 publications

(4 citation statements)

References 10 publications

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“…The first scheme used to test our FVF LDO is the intentional offset injection method similar to the one discussed in the previous section. While [17] discussed IOI method for classic LDOs, [18] specifically discusses IOI method for FVF LDOs. As IOI method is already explained in detail in previous section, we discuss the method for LDOs briefly in this subsection.…”

Section: Intentional Offset Injection Methods -Fvf Ldomentioning

confidence: 99%

“…Similar to the testing of operational amplifier, we test the defects in the FVF LDO using two similar methods. The first method is predominantly a DC testing method known as intentional offset injection (IOI) method for LDOs proposed in [17], [18] and the second testing method is the Oscillation Test Method (OTM) [15], [16].…”

Section: Defect Simulation: Fvf Low Drop-out Regulatormentioning

confidence: 99%

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Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Saikiran

Sekyere

Ganji

et al. 2022

Preprint

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Defect-oriented testing is becoming increasingly popular in recent times, especially in safety-critical applications in automotive, space and medical industries. The stringent quality requirements from these industries such as zero defective parts per million (DPPM) necessities a need to have efficient defect testing methods. Furthermore, the overall development time of integrated circuit can be reduced by reducing the defect simulation time. In this work, we present a simple and time-efficient defect simulation framework for pre-silicon testing of AMS circuits. In our method, a given defect model is realized using Verilog-A modules and tests multiple defects in a circuit in a single-run simulation. In contrast to the conventional defect simulation framework, our method saves simulation time by avoiding the repetitive work of generating a netlist for each defect and by reducing the time overhead for the simulator to interface with data/file-handling system. To strongly validate our proposed framework, we use diverse AMS circuits such as operational amplifier (op amp), fast transient flipped-voltage follower based low-dropout regulator (FVF LDO) and Successive-approximation-register (SAR) analog-to-digital converters (ADC). For DC testing schemes used for op amp and LDO testing, we show that our proposed framework reduces the simulation time to less than one-tenth (1/10th) in comparison with conventional framework. On the other hand, for the transient testing scheme, the proposed framework reduces the simulation time to less than 50% of the conventional framework. Furthermore, we also show that there is no negative impact on the defect coverage using the proposed framework.

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Section: Intentional Offset Injection Methods -Fvf Ldomentioning

confidence: 99%

Section: Defect Simulation: Fvf Low Drop-out Regulatormentioning

confidence: 99%

Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Saikiran

Sekyere

Ganji

et al. 2022

Preprint

View full text Add to dashboard Cite

show abstract

“…In this work, since the circuit is already quite simple, there is no need to break the circuit into smaller subcircuits. We use the intentional offset injection circuitry as an injector circuit for OA defect-oriented BIST [15], [16]. Digital window comparators, which are simply a combination of different inverters with specifically designed transition threshold voltages, are used as monitors for detecting the defects.…”

Section: Digital-like Defect Oriented Testmentioning

confidence: 99%

Digital-Like Built-In Defect-Oriented Test for Analog-Mixed Signal Circuits

GANJI,

Saikiran,

BHATHEJA

et al. 2023

Preprint

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<p>In this paper, we present a novel digital-like defect-oriented Built-In Self-Test (BIST) methodology for Analog and Mixed-Signal (AMS) circuits. The core idea of this approach centers around the segmentation of complex AMS circuits into smaller, more manageable units for analysis. Emphasizing resource utilization efficiency, we highlight the necessity of employing purely digital circuits for both injectors and monitors within the BIST framework. We demonstrate the effectiveness of this approach through the development of a BIST system for a 12-bit Successive Approximation Register Analog-to-Digital Converter (SAR ADC). Notably, our methodology achieves 100% defect coverage without introducing additional BIST circuitry for subcircuit testing, relying solely on digital monitors for sampling switch evaluation. Furthermore, our proposed approach incurs minimal area overhead, resulting in a fast and comprehensive defect-oriented BIST solution. This versatile test method can be deployed post-manufacturing or in-field, offering flexibility in its application timing.</p>

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“…Others also utilizes the multi-site testing capabilities of modern automated test equipment (ATE) to reduce test time [3,[13][14]. More recently, several design for test and build in self-test methods [15][16][17][18] have all been proposed as strategies to ensure continued reliability of IC through online health monitoring. Several high coverage op amp defect detection methods [19][20][21][22][23][24][25][26] have all been proposed.…”

Section: Introductionmentioning

confidence: 99%

Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits

Sekyere,

Marampally,

Chen

2023

Preprint

Self Cite

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Operational amplifiers (op amps) are fundamental blocks that find wide application both as stand-alone devices and as crucial building blocks embedded in various Systems on Chips (SoCs). Achieving high defect coverage as well as performing diagnosis and defect localization in these circuits has been proven to be a difficult/expensive task even with sophisticated analog and digital testing circuitry. ISO26262 Standard for functional safety (FuSa) places stringent requirement that an automotive IC must have a very high defect coverage (usually greater than 90%). This reinforce the need to improve the robustness in the design of analog and mixed signal (AMS) circuits to ensure their reliability especially if they are used in mission critical industries. This paper presents a simple defect detection, diagnosis, and localization method for op amps including Widlar current reference and biasing circuitry and can be used both for production and in-field tests for online health monitoring to ensure continued reliability during integrated circuits’ (IC) lifetime. We rigorously validate all our results using extensive transistor-level simulations of two op amps architectures (folded cascode and telescopic) designed in MUSE TSMC 180nm technology. For the folded cascode op amp, the proposed method achieves a worst-case defect coverage of 94.5% and a best-case coverage of 98%. Similarly for the telescopic op amp, the proposed method attains a worst- and best-case defect coverage of 97% and 99% respectively. Furthermore, in this work, we also propose a defect diagnosis and localization strategy using recorded bit streams from states of digital injectors and detectors.

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Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection

Cited by 7 publications

References 10 publications

Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Digital-Like Built-In Defect-Oriented Test for Analog-Mixed Signal Circuits

Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits

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