Digital-Like Built-In Defect-Oriented Test for Analog-Mixed Signal Circuits
MONA GANJI,
Marampally Saikiran,
KUSHAGRA BHATHEJA
et al.
Abstract:<p>In this paper, we present a novel digital-like defect-oriented Built-In Self-Test (BIST) methodology for Analog and Mixed-Signal (AMS) circuits. The core idea of this approach centers around the segmentation of complex AMS circuits into smaller, more manageable units for analysis. Emphasizing resource utilization efficiency, we highlight the necessity of employing purely digital circuits for both injectors and monitors within the BIST framework. We demonstrate the effectiveness of this approach throug… Show more
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