2005 European Microwave Conference 2005
DOI: 10.1109/eumc.2005.1610268
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RLC parasitic extraction and circuit model optimization for Cu/SiO/sub 2/-90nm inductance structures

Abstract: An efficient interconnects modeling and optimization methodology is proposed for multi-GHz clock network design. High frequency effects, including inductance and proximity effects are captured. The results are validated through comparisons with electromagnetic simulations and measured data taken from a Cu/SiO 2 90nm process test chip.

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Cited by 2 publications
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“…After determining γ and Z0, the values for R, L, and C can be directly obtained from: 9-11 [7], [10].…”
Section: B Obtained From S-parameters: Frequency Variant Modelmentioning
confidence: 99%
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“…After determining γ and Z0, the values for R, L, and C can be directly obtained from: 9-11 [7], [10].…”
Section: B Obtained From S-parameters: Frequency Variant Modelmentioning
confidence: 99%
“…In order to take into consideration the effects that become apparent at high frequencies, the works in [3], [6], [7] present a modeling approach based on S-parameter measurements. In these case works, the values for R l , L l , and C l are obtained from the characteristic impedance Z0 and the propagation constant γ of the interconnection, which are determined from S-parameter measurements.…”
Section: Introductionmentioning
confidence: 99%
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