2009
DOI: 10.1016/j.microrel.2009.02.026
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Risk of whiskers formation on the surface of commercially available tin-rich alloys under thermal shocks

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Cited by 12 publications
(7 citation statements)
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(15 reference statements)
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“…As a result of research, the risk of the occurrence of whiskers has been significantly reduced. The pure tin surface is one of the most favorable ones for whiskers [4,5], but they can also grow on tin-based alloys in various conditions [5,6]; however, this phenomenon has been observed on gold, silver and aluminum surfaces too [7]. For example, whisker growth can be caused by pressure [8][9][10].…”
Section: Introductionmentioning
confidence: 99%
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“…As a result of research, the risk of the occurrence of whiskers has been significantly reduced. The pure tin surface is one of the most favorable ones for whiskers [4,5], but they can also grow on tin-based alloys in various conditions [5,6]; however, this phenomenon has been observed on gold, silver and aluminum surfaces too [7]. For example, whisker growth can be caused by pressure [8][9][10].…”
Section: Introductionmentioning
confidence: 99%
“…For example, whisker growth can be caused by pressure [8][9][10]. The application of tin matte coating (by large grains with C content below 0.05%) helps to reduce the risk of the formation of whiskers, also avoiding pure Sn coating, the use of porosity-free coating of Ni, or a heat treatment of the surface [3,5]. Some of the typical formations of whiskers are shown in Fig.…”
Section: Introductionmentioning
confidence: 99%
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“…Skwarek et al found that commercially used tin-rich alloys Sn/Cu [8] and Sn/Ag/Cu can already develop tin whiskers under thermal shock tests [9,10], however the length of developed whiskers was only in the range of 10-20 µm which are not dangerous for the microelectronics. Horváth et al found that high tin content SnCu solder alloys (Cu1-5wt%) can produce tin whiskers under corrosive climate [11].…”
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confidence: 99%