“…In addition, XAFS characterization can directly distinguish between metal NPs and atomically dispersed atoms, but the acquired coordination structure is generally an averaged result [ 178 , 179 , 180 , 181 , 182 , 183 , 184 , 185 ]. Currently, a combination of characterization techniques, such as electron energy loss spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy (STM), non-contact atomic force microscopy (AFM), and DFT theoretical modeling, is required to obtain a relatively reliable local structure determination [ 181 , 182 , 183 , 184 , 185 , 186 , 187 , 188 , 189 ]. With the emergence of various in situ/operando characterization techniques in recent years, it has become feasible to directly monitor catalytic reaction processes, which would be extremely potent if applied in conjunction with advanced theoretical modeling.…”