2002
DOI: 10.1142/9789812777768_0001
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Rf Mos Measurements

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“…In our case, referring to the whole amplifier chip rather than individual transistors, we compare the DC supply current Icc vs. Vcc from measurements and simulations with the DC parameters. The extraction Software IC-CAP [4] was applied to this task. As depicted in Fig.…”
Section: -Noise Modelingmentioning
confidence: 99%
“…In our case, referring to the whole amplifier chip rather than individual transistors, we compare the DC supply current Icc vs. Vcc from measurements and simulations with the DC parameters. The extraction Software IC-CAP [4] was applied to this task. As depicted in Fig.…”
Section: -Noise Modelingmentioning
confidence: 99%