RF breakdown test of diamond-loaded resonator for high gradient wakefield accelerator applications

Antipov, Sergey; Baryshev, Sergey V.; Butler, James E.; Jing, C.; Kanareykin, A.; Schoessow, P.; Conde, Manoel; Wu, Gai; Power, John; Stoupin, Stanislav

doi:10.1016/j.diamond.2014.10.013

Cited by 4 publications

(2 citation statements)

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“…While the choice of diamond based on its physical properties is obvious, the practical implementation is challenging. Conventional laser cutting by standard nanosecond-pulse laser diamond cutters provides unsatisfactory results caused by thermal fatigue in diamond (Antipov et al, 2015). Unlike the conventional approach, femtosecond laser pulse duration is extremely short: the material is ablated and pulsed heating effects are minimized.…”

Section: Lens Fabrication and Metrologymentioning

confidence: 99%

Single-crystal diamond refractive lens for focusing X-rays in two dimensions

et al. 2016

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The fabrication and performance evaluation of single-crystal diamond refractive X-ray lenses of which the surfaces are paraboloids of revolution for focusing X-rays in two dimensions simultaneously are reported. The lenses were manufactured using a femtosecond laser micromachining process and tested using X-ray synchrotron radiation. Such lenses were stacked together to form a standard compound refractive lens (CRL). Owing to the superior physical properties of the material, diamond CRLs could become indispensable wavefront-preserving primary focusing optics for X-ray free-electron lasers and the next-generation synchrotron storage rings. They can be used for highly efficient refocusing of the extremely bright X-ray sources for secondary optical schemes with limited aperture such as nanofocusing Fresnel zone plates and multilayer Laue lenses.

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Section: Lens Fabrication and Metrologymentioning

confidence: 99%

Single-crystal diamond refractive lens for focusing X-rays in two dimensions

et al. 2016

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“…Наиболее перспективными материалами в данной области являются MPCVD-алмазы, выращенные методом осаждения из газовой фазы (chemical vapor deposition, CVD) в микроволновой плазме (microwave plasma, MP) [2][3][4][5][6][7].…”

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Диэлектрические потери в MPCVD-алмазах в полосах частот 25-30 и 250-350 GHz в зависимости от параметров процесса роста

Garin¹,

Паршин²,

Serov³

et al. 2018

Письма В Журнал Технической Физики

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Проведено комплексное систематическое исследование влияния различных параметров процесса роста CVD-алмазов в микроволновой плазме (MPCVD-алмазов), таких как температура подложки, химический состав газовой смеси и др., на диэлектрические потери в двух частотных полосах (25−30 и 250−350 GHz) более чем для десяти образцов различных серий. Выявлена корреляция между величинами потерь в этих двух полосах частот.

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