“…The measured value of the reverse current depends exponentially on the operating temperature in a straight forward way and $-values are therefore always normalized to 20C. Details for this normalization and the temperature dependent beneficial annealing, depicted in figure 7, can be found in [10,24]. At any given temperature and annealing time the damage rate $, if temperature normalized, is a universal constant, not depending on the material type (n-or p-type, FZ, epi or Cz silicon, resistivity), or irradiating particles (neutrons, protons, pions).…”