2015
DOI: 10.1016/j.synthmet.2014.12.009
|View full text |Cite
|
Sign up to set email alerts
|

Reversibility of humidity effects in pentacene based organic thin-film transistor: Experimental data and electrical modeling

Abstract: P-type organic thin-film transistors (OTFTs), in which the active semiconductor is made of pentacene with silicon dioxide as a gate insulator, were fabricated and characterized. The effects of humidity on the electrical characteristics of pentacene based thin-film transistors (pentacene-TFTs) in the linear and saturation regimes were investigated. We report the variation of the electrical parameters by relative humidity (RH) extracted from the experimental electrical characteristics current-voltage of pentacen… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
44
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 40 publications
(46 citation statements)
references
References 38 publications
(39 reference statements)
2
44
0
Order By: Relevance
“…The interface quality of the gate insulator/organic layer plays also a critical role in the electrical performance of OTFTs. The interface trap density of the DBP-TFTs was determined by the following formula [24,41]:…”
Section: Contact Resistance Versus Temperaturementioning
confidence: 99%
See 2 more Smart Citations
“…The interface quality of the gate insulator/organic layer plays also a critical role in the electrical performance of OTFTs. The interface trap density of the DBP-TFTs was determined by the following formula [24,41]:…”
Section: Contact Resistance Versus Temperaturementioning
confidence: 99%
“…8 (b), the D it values decreased with increasing of temperature for each fabricated device. For the current ratio and turn-on voltage parameters, we adapt the method used in [24] in order to determine the values of these two parameters versus temperature and for substrate temperature and they are shown in fig. 9 (a) and (b).…”
Section: Contact Resistance Versus Temperaturementioning
confidence: 99%
See 1 more Smart Citation
“…The contact resistance provides a measure of the injection efficiency of carrier charges into the active layer of the OTFTs and characterizes the S-D electrodes/organic semiconductor interface. Several methods have been proposed to extract the contact resistance in OTFTs [16][17][18][19][20]. In our case the estimation of the contact resistance values was done using the transfer line method (TLM) [17][18].…”
Section: Contact and Channel Resistances In Cupc-tftsmentioning
confidence: 99%
“…and from the SS values we can infer the density of the interface trap in the CuPc-TFTs by using the following expression [16,23]:…”
Section: Transfer Characteristics and Electrical Parameters Extractionmentioning
confidence: 99%