2016
DOI: 10.1007/s13391-015-5249-9
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Reverse bias leakage current mechanism of AlGaN/InGaN/GaN heterostructure

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Cited by 8 publications
(4 citation statements)
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“…Africa is the second-most populous and second-largest continent in the world. It covers 6% of the earth's total surface (20% of total land area) with a total area of about 30.3 × 10 6 km 2 [37]. Solar energy distribution in Africa is fairly uniform and the global solar horizontal irradiance for a larger proportion (85%) of the landscape is over 2000 kWh/m 2 /year.…”
Section: Area Of Studymentioning
confidence: 99%
“…Africa is the second-most populous and second-largest continent in the world. It covers 6% of the earth's total surface (20% of total land area) with a total area of about 30.3 × 10 6 km 2 [37]. Solar energy distribution in Africa is fairly uniform and the global solar horizontal irradiance for a larger proportion (85%) of the landscape is over 2000 kWh/m 2 /year.…”
Section: Area Of Studymentioning
confidence: 99%
“…实验研究表明, 在Al x Ga 1-x N/GaN单异质结 中间生长一层In y Ga 1-y N作为沟道层, 使原先的单 异 质 结 转 变 为 双 异 质 结 . 与 原 先 的 单 异 质 结 Al x Ga 1-x N/GaN相比, 双异质结Al x Ga 1-x N/In y Ga 1-y N/GaN具有更强的载流子限制, 更高的迁移率和 2DEG浓度, 同时可以显著改善器件性能 [10] . 这些 优良特征促使实验研究工作者开展这方面的研究, Chakraborty等 [11] 用分子束外延法在GaN/Si(111) 上生长 AlGaN/InGaN异质结构, 同时研究AlGaN/ InGaN/GaN异质结的反向偏置漏电流机制; Bag 等 [12] 通过实验结果推测InGaN的不熔性阻碍了 高质量AlGaN/InGaN异质结的外延生长, 针对 高速器件, AlGaN/InGaN/GaN的性能可能优于 AlGaN/GaN的 性 能 ; Simin等 [13]…”
unclassified
“…These features have inspired experiments to compare the performance characteristics of electron devices based on an AlGaN= GaN heterostructure versus an AlGaN=InGaN=GaN heterostructure. [19][20][21][22] On the other hand, most experimental and theoretical studies pertaining to distributed surface donor states are focused on AlGaN=GaN-, AlGaN=AlN=GaN-, and InAlN=AlN=GaN-based heterostructures. 2,4,5,[23][24][25] In all these cases, the GaN buffer is considered as the channel material.…”
mentioning
confidence: 99%
“…Note that the previously reported simulations for AlGaN= InGaN=GaN (as well as AlGaN=InGaN) heterostructure(s) obtained the band diagram and carrier distribution by fitting simulations to the experimental measurements of the 2DEG densities and thus did not include surface states. 9,19,29,[40][41][42] Therefore, these methods cannot address the dependence of the SBH on the AlGaN material and In mole fraction of the channel. Instead, an iterative approach to determine the electron density due to the surface donor states must be taken.…”
mentioning
confidence: 99%