2020
DOI: 10.1002/adma.202005481
|View full text |Cite
|
Sign up to set email alerts
|

Revealing Electrical‐Poling‐Induced Polarization Potential in Hybrid Perovskite Photodetectors

Abstract: Despite recent rapid advances in metal halide perovskites for use in optoelectronics, the fundamental understanding of the electrical‐poling‐induced ion migration, accounting for many unusual attributes and thus performance in perovskite‐based devices, remain comparatively elusive. Herein, the electrical‐poling‐promoted polarization potential is reported for rendering hybrid organic–inorganic perovskite photodetectors with high photocurrent and fast response time, displaying a tenfold enhancement in the photoc… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
33
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
10

Relationship

0
10

Authors

Journals

citations
Cited by 24 publications
(34 citation statements)
references
References 44 publications
1
33
0
Order By: Relevance
“…Some reports showed the phenomenon of current amplification in photodetectors and attributed the cause of this phenomenon to ion migration. [91][92][93] Light induced ions migrate from the working region to the electrode; thus the working region body defects are reduced and the dark current is decreased. In addition, the ions' migration and accumulating at the interface induces charge injection, to amplify the current.…”
Section: Other Applicationsmentioning
confidence: 99%
“…Some reports showed the phenomenon of current amplification in photodetectors and attributed the cause of this phenomenon to ion migration. [91][92][93] Light induced ions migrate from the working region to the electrode; thus the working region body defects are reduced and the dark current is decreased. In addition, the ions' migration and accumulating at the interface induces charge injection, to amplify the current.…”
Section: Other Applicationsmentioning
confidence: 99%
“…Further, electric field induced ion migration primarily across perovskite grain boundaries further enhances material degradation, eventually worsening optoelectronic properties. 61 However, at the same time, the C-AFM and PC-AFM studies carried out by Li et al in MAPbI 3 /CdS heterojunction PD indicated that the short transport distance at the grain boundaries acted as preferential spots of charge carrier transportation and exciton separation. 62 The study of the photoelectric mechanism at nanoscale showed that higher photocurrent values are observed at grain edges.…”
Section: P-n (Or P-i-n) Junction-based Pdsmentioning
confidence: 98%
“…The MASP strategy was also used in other areas and shows great potential. [95][96][97][98] Lin et al made perovskite films with large grains, yielding a 17.51% PCE.…”
Section: Meniscus-assisted Solution-printingmentioning
confidence: 99%