Response Mechanisms and New Approaches with Solid‐State Ion‐Selective Electrodes: A Powerful Multitechnique Materials Characterization Approach

Abstract

In modern materials science, there is a plethora of characterization techniques of materials that can provide valuable insights into the fundamental chemical physics of solid-state devices such as chalcogenide glass ion-selective electrodes (ISEs). In this paper, electrochemical impedance spectroscopy (EIS), X-ray photoelectron spectrometry (XPS) and secondary ion mass spectrometry (SIMS) have been used in the elucidation of the mechanistic chemistry of the cadmium chalcogenide glass ISE. Furthermore, in situ synchrotron radiation-grazing incidence X-ray diffraction (SR-GIXRD), in situ EIS/SR-GIXRD, along with small angle neutron scattering (SANS), can be used to unravel the complex relationship between the nanostructure, bulk electrical conductivity and concomitant electrochemical reactivity of an iron chalcogenide glass ISE. Significantly, exciting preliminary modified atomic force microscopy (AFM) data -utilizing AFM cantilevers with attached microparticles of the copper sensing material jalpaitedemonstrate the tremendous potential of selective force ISE-AFM in the imaging of important molecular structures such as the copper ion channels of cell membranes in fish gills and/or phytoplankton.

Atomic Force Microscopy and X‐Ray Photoelectron Spectroscopy of Lead(II) Membrane Electrode Based on Dithiodibenzoic Acid as Ionophore

“…The main advantage of AFM compared to SEM is its ability to image the surface in situ as it experiences its inherent solution chemistry [23,24]. In addition, AFM can image a plastic membrane surface in its natural state without neither coating nor subjecting to a highly reduced pressure.…”

“…The tip of the atomic force microscope has been silanized to nanocharactarize the surface of a Cu(II) PVC-membrane electrode [23]. De Marco et al used AFM cantilever comprising a copper ion selective electrode tip to differentiate between a copper releasing and non-copper releasing substrates [24]. AFM and X-rayphotoelectron spectroscopy in combination with scanning electron microscopy, secondary ion mass spectrometry, and electrochemical impedance spectroscopy were employed to study the physical and chemical integrity of solid-contact conductive polymeric ion sensors [25].…”