Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2014
DOI: 10.1109/ipfa.2014.6898173
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Resolving systematic voltage sensitive soft failures in 28nm microprocessor devices

Dnyan Khatri1,
Soon Huat Lim2,
Mun Yee Ho3
et al.
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Cited by 3 publications
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References 7 publications
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Efficient defect identification of soft failures induced by device local mismatch for nano-scale SRAM yield improvement

Kuo
1
,
Wei
2
,
Cai
3
et al. 2017
Materials Science in Semiconductor Processing
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Efficient defect identification of soft failures induced by device local mismatch for nano-scale SRAM yield improvement

Kuo
1
,
Wei
2
,
Cai
3
et al. 2017
Materials Science in Semiconductor Processing
0
0
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0
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Combining design simulations with nano-probing to root-cause a processor device glitch issue

Teo
1
,
Khatri
2
,
Wei
3
et al. 2015
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits
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Simulation assisted uncovering and understanding of complex failures in 28nm microprocessor devices

Khatri1,
Narang2,
Ho3
et al. 2016
2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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