Resolution issues in InSb focal plane array system design

Davis, Mike; Greiner, Mark E.; Sanders, John G.; Wimmers, James T.

doi:10.1117/12.317596

Cited by 14 publications

(4 citation statements)

References 6 publications

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“…Crosstalk in detector arrays (and systems) from various other sources has been considered. 4,5,6,7,8,9 The optical system's PSF frequently contributes crosstalk to observed results, and must be distinguished from that of the array. "Optical crosstalk" (reflection of light within the detector) may also be significant if penetration depth is large.…”

Section: Basic Mechanismmentioning

confidence: 99%

Interpixel capacitance in nondestructive focal plane arrays

2004

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Inter-pixel capacitive coupling can exist in a non-destructive detector array if the detector nodes change voltage as they integrate charge and the design of the device allows for an electric field to exist between adjacent collection nodes. Small amounts of inter-pixel capacitance can cause large errors in the measurement of poissonian noise versus signal, and all subsequently derived measurements such as nodal capacitance and quantum efficiency. Crosstalk and MTF can also be significantly influenced by interpixel capacitance. Two 1k × 1k Raytheon SB226-based hybridized silicon PIN arrays were tested for nodal capacitance and MTF. Initial results indicated unexpected and unexplainably large nodal capacitance, poor MTF, and odd edge spread. It was hypothesized that inter-pixel capacitive coupling was responsible for these discrepancies. A stochastic method of measuring the coupling using 2D autocorrelation and Fourier Transform techniques was devised and implemented. Autocorrelation of the shot noise in the images revealed a correlation consistent with 3.2% interpixel capacitive coupling. When the effects of the measured interpixel capacitance were taken into account, the initially measured nodal capacitance of 56 fF was found to be 30% higher than the corrected nodal capacitance measurement of 43 fF. Large discrepancies between the theoretical and observed edge spread response were also greatly reduced. A simulation of the electric field in the PIN detector intrinsic region predicted an interpixel coupling very close to the observed coupling. Interpixel capacitance was also observed in 2k × 2k Raytheon SB304-based InSb detector arrays, but was not strongly evident in a bare Raytheon SB226 multiplexer.

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Section: Basic Mechanismmentioning

confidence: 99%

Interpixel capacitance in nondestructive focal plane arrays

2004

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“…For a model of carrier diffusion effects on MTF in backside illuminated arrays, see Crowell and Labuda. 7 For the effect of this model on MTF in InSb arrays, see Davis et al 8 The arrays discussed here are reticulated with pixels physically isolated from each other. This means the MTF advantage is scalable to the small 15 μm pitched pixels and even smaller pixels in the future.…”

Section: Resolution or Modulation Transfer Function Of The Reticulatementioning

confidence: 99%

Indium antimonide large-format detector arrays

Davis

Greiner

2011

Opt. Eng

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Large format infrared imaging sensors are required to achieve simultaneously high resolution and wide field of view image data. Infrared sensors are generally required to be cooled from room temperature to cryogenic temperatures in less than 10 min thousands of times during their lifetime. The challenge is to remove mechanical stress, which is due to different materials with different coefficients of expansion, over a very wide temperature range and at the same time, provide a high sensitivity and high resolution image data. These challenges are met by developing a hybrid where the indium antimonide detector elements (pixels) are unconnected islands that essentially float on a silicon substrate and form a near perfect match to the silicon read-out circuit. Since the pixels are unconnected and isolated from each other, the array is reticulated. This paper shows that the front side illuminated and reticulated element indium antimonide focal plane developed at L-3 Cincinnati Electronics are robust, approach background limited sensitivity limit, and provide the resolution expected of the reticulated pixel array. C 2011 Society of Photo-Optical Instrumentation Engineers (SPIE).

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“…Another good use for the "lost" active area is to serve as a guard band to greatly reduce diffusion of charge carriers from one detector element to the other. Such diffusion leads to parasitic low pass spatial filtering of the imagery, causing an additional loss of resolution [12].…”

Section: Rectangular and Circular Detectorsmentioning

confidence: 99%

“…A large fill factor is generally considered to be desirable because more photons are collected for a given pitch, and this leads to a higher SNR. However, the large active area works against SR image restoration by acting as an additional low pass filter in the overall PSF when modeled on the SR sampling grid [12]. A high fill factor also tends to increase blurring from pixel cross-talk [12,13].…”

Section: Introductionmentioning

confidence: 99%