2016
DOI: 10.1016/j.physc.2016.05.003
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Resistivity tensor correlations in the mixed state of electron-doped superconductor Nd2xCe x CuO4+δ

Abstract: The magnetic-field dependencies of the longitudinal and Hall resistance of the electron-doped compounds Nd 2−x Ce x CuO 4+δ in underdoped region with x = 0.14 and with varying degrees of disorder (δ) were investigated. It was established experimentally that the correlation between the longitudinal electrical resistivity and the Hall resistivity can be analyzed on the basis of scaling relationships: ρ xy (B)∼ ρ β xx (B). For the totality of the investigated single-crystal films of Nd 2−x Ce x CuO 4+δ /SrTiO 3 t… Show more

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Cited by 9 publications
(7 citation statements)
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“…Here we report the analysis of polarized As K-edge extended x-ray-absorption finestructure (EXAFS) measurements of undoped and cobalt doped LaFeAsO performed to unveil the local fast Fe-As zero point fluctuations in a double-well potential. This approach was successfully applied to hole doped cuprates [24][25][26][27], Ba 1-x K x BiO 3 and electron doped cuprates [28][29][30]. Polarized As K-edge EXAFS in 1111 systems gives instantaneous pair distribution function between As and neighboring Fe atoms.…”
Section: Introductionmentioning
confidence: 99%
“…Here we report the analysis of polarized As K-edge extended x-ray-absorption finestructure (EXAFS) measurements of undoped and cobalt doped LaFeAsO performed to unveil the local fast Fe-As zero point fluctuations in a double-well potential. This approach was successfully applied to hole doped cuprates [24][25][26][27], Ba 1-x K x BiO 3 and electron doped cuprates [28][29][30]. Polarized As K-edge EXAFS in 1111 systems gives instantaneous pair distribution function between As and neighboring Fe atoms.…”
Section: Introductionmentioning
confidence: 99%
“…1a. In the mixed state the longitudinal and Hall resistivities there are the resistivity correlations ρ xy (B)∼ [ρ xx (B)] β that was found for different kinds of HTSC (see references in [15]). The log-log plot for Nd 1.85 Ce 0.15 CuO 4+δ /SrTiO 3 films with different disorder parameters k F ℓ at T = 4.2K (Fig.…”
Section: Experimental Details Results and Discussionmentioning
confidence: 93%
“…As a result, three types of samples with x=0.15 were obtained: "as grown" samples, "optimally reduced" -after annealing in a vacuum and "non optimally reduced" samples [14]. For films with x = 0.14 were obtained two types of samples: "optimally reduced" and two samples "non optimally reduced" -non optimally annealed in vacuum [14,15]. The thickness of the films was d = 1600-3800Å.…”
Section: Experimental Details Results and Discussionmentioning
confidence: 99%
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