2020
DOI: 10.1016/j.jallcom.2020.154434
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Resistive switching and synaptic behaviors of an HfO2/Al2O3 stack on ITO for neuromorphic systems

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Cited by 64 publications
(33 citation statements)
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“…Currently, 2D thin film materials such as graphene and graphene oxide (GO) are also attracting increasing attention as candidates of electrode because of the excellent mobility of carriers and high thermal/electrical conductivity [15][16][17]. Compared with electrode thin film materials, more researchers focus on thin film materials applicated on RS medium, and inorganic materials are the main investigation objectives, including oxides and solid electrolyte, which will be discussed in Chapter 3 [11,[18][19][20][21][22][23][24][25][26][27].…”
Section: Biological (Silk Protein) Polymer (Pvk) Perovskite (Ch3nh3snmentioning
confidence: 99%
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“…Currently, 2D thin film materials such as graphene and graphene oxide (GO) are also attracting increasing attention as candidates of electrode because of the excellent mobility of carriers and high thermal/electrical conductivity [15][16][17]. Compared with electrode thin film materials, more researchers focus on thin film materials applicated on RS medium, and inorganic materials are the main investigation objectives, including oxides and solid electrolyte, which will be discussed in Chapter 3 [11,[18][19][20][21][22][23][24][25][26][27].…”
Section: Biological (Silk Protein) Polymer (Pvk) Perovskite (Ch3nh3snmentioning
confidence: 99%
“…In this review, we will present RRAM-related inorganic materials with oxides, solid electrolyte and two-dimensional (2D) materials. [9,20,75], NiO [8,12,76], TiO 2 [21,77,78], HfO 2 [60,79,80], ZnO [81][82][83], and ZrO 2 [22,84,85] are always playing main roles in materials application of RS medium. The first report of RS performance in binary metal oxides was proposed by Hickmott in 1962 [91], which demonstrated the RS characteristics of Al/Al 2 O 3 /Al device under the effect of an electric field.…”
Section: Thin Film Materials Of Rs Mediummentioning
confidence: 99%
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“…Notably, the operating currents are significantly reduced despite increased pulse voltage amplitudes for SET and RESET processes in Ag/TiO 2 /ZrN/Si device. In the literature, for the phenomena in which the gradual characteristics are improved according to the additional layer insertion [ 38 , 39 ], the operation polarity change [ 40 ] and dielectric thickness control [ 41 ] of the device were reported.…”
Section: Resultsmentioning
confidence: 99%