Resistência de seis cultivares de soja ao Colletotrichum truncatum (Schwein) em dois estádios fenológicos

Costa, Ivan Francisco Dressler da; Balardin, Ricardo Silveiro; Medeiros, L.A.; Bayer, Tânia

doi:10.1590/s0103-84782006000600003

Cited by 10 publications

(9 citation statements)

References 9 publications

(7 reference statements)

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…However, further studies are required to investigate this presumption. Similar mechanisms were also reported in other pathosystems (Rava et al 1999, Costa et al 2006). …”

Section: Vivas Et Alsupporting

confidence: 84%

Phenotypic characterization of papaya genotypes to determine powdery mildew resistance

Vivas

Silveira²,

Vivas³

et al. 2017

Crop Breed. Appl. Biotechnol.

View full text Add to dashboard Cite

Abstract:In support of breeding of papaya (Carica papaya) 'Caliman M5', 'GTF', and 'JS 11'. In the greenhouse experiment, the genotypes 'Caliman M5', 'Golden', 'Kapoho Solo', 'Waimanalo', 'Mamão Bené', 'JS 12', and 'GTF' had the lowest mean incidence in at least one evaluation. On the other hand, for severity, the genotypes 'Diva', 'Sunrise Solo 72/12', 'Kapoho Solo PA', 'Waimanalo', 'Maradol', 'Maradol GL', 'FMV, had the lowest means. These results indicate these genotypes for a possible use in breeding for reduction of powdery mildew intensity.

show abstract

“…However, further studies are required to investigate this presumption. Similar mechanisms were also reported in other pathosystems (Rava et al 1999, Costa et al 2006). …”

Section: Vivas Et Alsupporting

confidence: 84%

Phenotypic characterization of papaya genotypes to determine powdery mildew resistance

Vivas

Silveira²,

Vivas³

et al. 2017

Crop Breed. Appl. Biotechnol.

View full text Add to dashboard Cite

show abstract

“…However, only three lines were resistant in both environments. In both evaluation stages, plants present the so-called adult plant resistance that is mainly horizontal and has been described in several studies (Barcellos et al, 2000;Costa et al, 2006;Burdon et al, 2014). "Partial resistance" or horizontal resistance slows the process of infection, growth and pathogen reproduction in adult plants, but not in seedlings (Costa et al, 2006).…”

Section: Discussionmentioning

confidence: 99%

Phenotyping for angular leaf spot severity and its implication in breeding common bean for resistance

Pereira

Abreu

Nalin

et al. 2019

Sci. agric. (Piracicaba, Braz.)

View full text Add to dashboard Cite

Phenotyping for severity of angular leaf spot (ALS) in common bean is important to identify new sources of resistance and select progenies in conventional and molecular markerassisted breeding. In this study, three phenotyping methods for ALS severity were assessed and its implications in breeding for resistance to Pseudocercospora griseola are discussed. Reaction of 144 common bean lines to P. griseola was evaluated. Three different experiments were conducted in the greenhouse (V2 and V3 stages) and in the field. Common bean lines were inoculated with a mixture of spores of pathogen races 63-63 and 63-23. We observed that 31 %, 7 % and 10 % of lines were resistant in stages V2, V3 and in the field, respectively. Estimates of coincidence index V2-V3, V2-field and V3-field were 68 %, 69 % and 88 %, respectively. Evaluations in V3 stage and in the field were the phenotyping methods more efficient for ALS severity. However, evaluation in V3 stage is impracticable to assess routinely many genotypes in breeding programs. Evaluation in V2 stage may be used to carry out a first screening, especially in the early stages of breeding programs. Moreover, this methodology may be used in association with evaluation of plants in the field to increase genetic gain.

show abstract

“…Plants in V2 stage are more susceptible to pathogens, therefore diseased leaf area affected is higher (Costa et al 2006). Thus, when plants are evaluated in initial stages of development, more severe symptoms are expected.…”

Section: Discussionmentioning

confidence: 99%

Diagrammatic scale to evaluate angular leaf spot severity in primary leaves of common bean

Librelon

Souza

Pereira

et al. 2015

Australasian Plant Pathol.

View full text Add to dashboard Cite

The aim of this study was to develop a diagrammatic scale to evaluate angular leaf spot (ALS) severity in primary leaves of common bean. A diagrammatic scale was developed and validated with nine levels of severity: 0 %; 0.1 to 0.5 %; 0.6 to 4.0 %; 4.1 to 7.0 %; 7.1 to 16 %; 16.1 to 26 %; 26.1 to 32 %; 32.1 to 38 % and 38.1 to 60 %. The use of this scale, associated with the early inoculation method, allowed rating of ALS severity in common bean leaves in the V2 stage of development that is, when the primary leaves are fully open. Validation of the scale was performed by 14 Evaluators. These Evaluators estimated the severity in 40 common bean leaves with different levels of severity, previously measured by the software Quant®. The accuracy and precision of each Evaluator were determined by simple linear regression, by comparing between actual severity, measured electronically, and that estimated by the Evaluator. Without the scale, most of the Evaluators overestimated the severity of the disease. With the scale, the Evaluators obtained better levels of accuracy and precision, with absolute errors less than 5 %. The diagrammatic scale proposed proved to be adequate for early performance of the pathogenicity test.

show abstract

Resistência de seis cultivares de soja ao Colletotrichum truncatum (Schwein) em dois estádios fenológicos

Abstract: Resistance of six soybean cultivars to

Cited by 10 publications

References 9 publications

Phenotypic characterization of papaya genotypes to determine powdery mildew resistance

Phenotypic characterization of papaya genotypes to determine powdery mildew resistance

Phenotyping for angular leaf spot severity and its implication in breeding common bean for resistance

Diagrammatic scale to evaluate angular leaf spot severity in primary leaves of common bean

Contact Info

Product

Resources

About