Abstract:Here, we demonstrate that oxide thin film devices could be affected by humidity in their in-plane stress and in substrate curvature. We prepared silica glass and ceria crystalline thin films on Si(100) wafers by the sol-gel method. Both films had “tensile” in-plane residual stress. We cycled the relative humidity between ca. 20% and 80% in the square wave and monitored the substrate curvature in situ, from which in-plane stress was calculated. The increase and decrease in humidity resulted in a decrease and an… Show more
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