Residual losses in a guard-ring micrometer-electrode holder for solid-disk dielectric specimens

Abstract

A guard-ring m icr.ometer-cl ectmde holder especiall y d es igned for use in ma king di electri c m eas urements on sohd-dL s k sp ecimens of low-loss mate ri a ls has been constructed. A metho~ of de~e rminin g th e sepa rati(;H1 of t he electmdes to ± 1 micron, usin g ball reference gages,. L S d escnbed . R es ldu a ll o ss~s LLl t he guard-rin g holder, a nd also in t he bridge standard capaci to r used In the Schenn g bndge employed for the measurements, caused by losses i n s ur:ace film s o n t he clectrod es and by seri es r esistance in t he leads, were accura tely measured . It IS shown t hat at fr equ encies fr om 100 cycles pe r seco nd to 100 kilo cycles per second t hese resLdu a llosses a re .not .more t ha n a fe \\' microradi a ns. Us ing co rrections t hu s obtained , t ile hold er-bridge co mbinatIO n can be used to measure t he losses of low-l oss mate ri a ls with grel"lter accuracy t ha n heretofor e. .

Traceable measurements of the static permittivity of dielectric reference liquids over the temperature range 5–50 °C

“…There are published admittance cell designs using parallel-plate [11,[13][14][15] and cylindrical geometries [16][17][18][19], both of which may be used in two-and three-terminal (electrode) configurations. In [18], an admittance cell based on Thompson and Lampard's 'cross-capacitance' theorem [20] is proposed.…”