1989
DOI: 10.1007/bf00209695
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Dielectric constants of BeO, MgO, and CaO using the two-terminal method

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Cited by 85 publications
(35 citation statements)
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“…The agreement between the observed dielectric polarizability of the peridot and that calculated from the sum of the oxide polarizabilities according to the oxide additivity rule (Eqn 3) is excellent. The deviation between the observed and calculated values for tephroite is significantly larger than the typical 1% variation observed previously for a series of aluminates, gallates and silicates Subramanian et al 1989;Shannon et al 1989Shannon et al , 1990Shannon 1990). Using dielectric data of Plendl et al (1969) which we believe to be less accurate than the data of Seehra et al (1986) still leaves a deviation of + 1.4%.…”
Section: Resultsmentioning
confidence: 46%
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“…The agreement between the observed dielectric polarizability of the peridot and that calculated from the sum of the oxide polarizabilities according to the oxide additivity rule (Eqn 3) is excellent. The deviation between the observed and calculated values for tephroite is significantly larger than the typical 1% variation observed previously for a series of aluminates, gallates and silicates Subramanian et al 1989;Shannon et al 1989Shannon et al , 1990Shannon 1990). Using dielectric data of Plendl et al (1969) which we believe to be less accurate than the data of Seehra et al (1986) still leaves a deviation of + 1.4%.…”
Section: Resultsmentioning
confidence: 46%
“…Sputtered gold electrodes were applied over the entire parallel surfaces of the sample using a Denton Vacuum Desk II sputtering unit. Sample preparation is described in detail in Subramanian et al (1989).…”
Section: Methodsmentioning
confidence: 99%
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“…The room-temperature fundamental absorption in this material occurs at 7.6 eV with a probable second peak at 8.8 eV [34]. The dielectric constant of this material is 10 [35]. Thus, highly-insulating nature of this material, provides an opportunity to be utilized in fabrication of magnetic tunnel junctions, an important spintronic device [36].…”
Section: General Propertiesmentioning
confidence: 99%
“…The dielectric measurements were carried out by a parallel plate capacitance technique using a HIOKI 3531 Z Hitester according to the procedure described by Subramanian et al [14] in 1989. Also, according to the ASTM standard test methods [15], two equal electrodes (smaller than the specimen) were prepared using high-conductivity silver paint.…”
Section: Dielectric Measurementsmentioning
confidence: 99%