Research Progress in Breakdown Enhancement for GaN-Based High-Electron-Mobility Transistors
Zhiwen Tian,
Xuan Ji,
Dongwei Yang
et al.
Abstract:The breakdown characteristics are very important for GaN high-electron-mobility transistors (HEMTs), which affect the application voltage, power density, efficiency, etc. In order to further enhance the breakdown voltage of the device, it is necessary to carry out research on the breakdown mechanisms of the device. This article summarizes several breakdown mechanisms of GaN devices, including electric field concentration, buffer leakage current, gate leakage current, and vertical breakdown. In order to suppres… Show more
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