Abstract:In the weapon system, with the improvement of the equipment performance, the system complexity also increases. Functional failure will cause the system to malfunction or even become a disaster. Therefore, system-level comprehensive detection for Mission Electronic System is the urgent issue in the field of weaponry and equipment. First of all, this paper gives the definition of both static and dynamic problems, which are caused by the upgrade of the complexity. Secondly, we establish a formal model for static … Show more
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