“…More recent work in XRTS focuses on the information found in the elastic scattering feature; various authors use the strength of the elastic scattering feature to deduce plasma properties, such as the ion structure factor [32], the ionization state [4,5,30,36,49,50], or the screening properties [34]. The values of f (k), q(k), and S ii (k, ω) all depend on the magnitude of the scattering vector, k, which depends on the frequency of incident radiation, ω i , and the scattering angle, θ.…”