Reliability Characterization of a Flexible Interconnect for Cryogenic and Quantum Applications

Schmidgall, E. R.; Griggio, Flavio; Thiel, George H.; Peek, Sherman E.; Yelamanchili, Bhargav; Shah, Archit; Gupta, Vaibhav; Sellers, John A.; Hamilton, Michael C.; Tuckerman, David B.; d'Hollosy, Samuel

doi:10.1109/irps46558.2021.9405090

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Reliability Characterization of a Flexible Interconnect for Cryogenic and Quantum Applications

Cited by 3 publications

References 8 publications

Superconducting Microwave Interconnect Technologies for Quantum and Cryogenic Systems

Superconducting Microwave Interconnect Technologies for Quantum and Cryogenic Systems

Face-to-Face Cable Interconnect Scheme for Thin Flexible Superconducting Stripline Cables

Integrated Superconducting Transition-Edge-Sensor Energy Readout (ISTER)

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