Microelectronics Reliability
 2014
DOI: 10.1016/j.microrel.2013.08.013
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Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena

Engín Afacan
1
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Günhan Dündar
2
,
I. Faik Baskaya
3
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Cited by 8 publications
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References 11 publications
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Aging signature properties and an efficient signature determination tool for online monitoring

Afacan
1
,
Dündar
2
,
Pusane
3
et al. 2017
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Aging signature properties and an efficient signature determination tool for online monitoring

Afacan
1
,
Dündar
2
,
Pusane
3
et al. 2017
Integration
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0
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Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation

Dhar
1
,
Sapatnekar
2
2019
2019 IEEE International Reliability Physics Symposium (IRPS)
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Synthesis of a Family of Differential Cross-coupled Oscillators and Design Application

Maundy
1
,
Elwakil
2
,
Elamien
3
et al. 2018
2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)
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