Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation

Dhar, Tonmoy; Sapatnekar, Sachin S.

doi:10.1109/irps.2019.8720447

2019 IEEE International Reliability Physics Symposium (IRPS) 2019

DOI: 10.1109/irps.2019.8720447

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Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation

Tonmoy Dhar

Sachin S. Sapatnekar

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Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation

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References 11 publications

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