Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers

Herrick, Robert W.

doi:10.1007/978-1-4614-4337-7_6

Cited by 13 publications

(16 citation statements)

References 49 publications

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“…The underlying failure mechanisms of VCSELs and related test methods have been extensively studied in the literature [3,4,5]. These failure mechanisms are categorized into wear-out failures, where material degradation occurs over time as a function of temperature and current density, and random failures that are linked to material defects and Extensive research has been conducted on 980 nm VCSELs, primarily for high-power applications.…”

Section: Vcsels For Automotive Applicationsmentioning

confidence: 99%

Optical neurons to interconnect sensors and artificial brains in autonomous vehicles

Pérez‐Aranda,

Pankert

2023

PhotonicsViews

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With the ever‐increasing need for faster data communication in cars, electrical interconnects are beginning to show bandwidth and electromagnetic compatibility limitations. The new IEEE 802.3cz ethernet physical layer has been developed specifically to meet these needs, based on a long‐wavelength multimode VCSEL (vertical cavity surface‐emitting laser) and mature bend‐insensitive multimode fibers. A major innovation is taking place that will make automotive‐grade, multigigabit optical transceivers possible.

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Section: Vcsels For Automotive Applicationsmentioning

confidence: 99%

Optical neurons to interconnect sensors and artificial brains in autonomous vehicles

Pérez‐Aranda,

Pankert

2023

PhotonicsViews

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“…[7][8][9] Most field failures observed in VCSELs are due to these dislocations. While the dislocations may take a year or more of operation to migrate into the emitting area, once they reach it, they usually will take only about 10 min between their first appearance and the total loss of function.…”

Section: Vcsel Failure Mechanismsmentioning

confidence: 99%

“…One limitation of present VCSELs is that nearly all VCSELs produced to date use a GaAs quantum well in the active region, which is vulnerable to ''dark line defects'': these are fast growing climb dislocations in the active region. [7][8][9] Most field failures observed in VCSELs are due to these dislocations. While the dislocations may take a year or more of operation to migrate into the emitting area, once they reach it, they usually will take only about 10 min between their first appearance and the total loss of function.…”

Section: Vcsel Failure Mechanismsmentioning

confidence: 99%

Reliability of Vertical-Cavity Surface-Emitting Lasers

Herrick

2012

Jpn. J. Appl. Phys.

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Vertical-cavity surface-emitting lasers (VCSELs) are among the least expensive lasers available, and have been widely deployed for data communications and illumination applications. They have also proved to be one of the most reliable types of lasers, due to the lack of exposed facets, and the relatively small area of the chip that is vulnerable to defects. We discuss measures that have proven necessary to obtain good reliability, focusing especially on reliability qualification and analysis. We also briefly discuss failure analysis techniques and future VCSEL reliability challenges. #

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“…VCSEL reliability has been investigated by many research groups, notably Herrick et al [6]- [9]. Due to the complicated structure of these devices, VCSELs must be designed with electrical, mechanical, optical, and thermal considerations taken into account.…”

Section: Introductionmentioning

confidence: 99%

“…Due to the complicated structure of these devices, VCSELs must be designed with electrical, mechanical, optical, and thermal considerations taken into account. There are many possible failure modes in VCSELs, including semiconductor lattice defects such as the so-called "Dark-line" defects, dopant migration, non-uniform current injection, and copper poisoning [9]. One powerful technique for investigating VCSEL failures and reliability is electroluminescence (EL) imaging, in which light emitted by the device is imaged under a microscope.…”

Section: Introductionmentioning

confidence: 99%

Optical Beam Induced Current and Time Resolved Electro-Luminescence in Vertical Cavity Surface Emitting Lasers During Accelerated Aging

et al. 2019

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Vertical Cavity Surface Emitting Lasers are characterized under a high magnification optical microscope for reliability during accelerated aging using Optical Beam Induced Current and Electroluminescence imaging and spectroscopy, and also with electrical IV characterization. EL image data is captured with time resolution during device failure, and compared to the OBIC images, yielding insight into failure mechanisms. In particular, sudden, localized, permanent reductions in EL intensity around the outside of the laser oxide aperture are observed during the period of failure, indicating step-wise rather than gradual degradation in laser performance. These failure events are temporally correlated with sudden increases in low-injection junction current. Both OBIC and IV characterization suggest mid-gap defect formation as the cause of the observed failures.

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Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers

Cited by 13 publications

References 49 publications

Optical neurons to interconnect sensors and artificial brains in autonomous vehicles

Optical neurons to interconnect sensors and artificial brains in autonomous vehicles

Reliability of Vertical-Cavity Surface-Emitting Lasers

Optical Beam Induced Current and Time Resolved Electro-Luminescence in Vertical Cavity Surface Emitting Lasers During Accelerated Aging

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