2022
DOI: 10.1016/j.microrel.2021.114461
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Reliability analysis and condition monitoring of SAC+ solder joints under high thermomechanical stress conditions using neuronal networks

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Cited by 9 publications
(3 citation statements)
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“…24,25 However, the proposed ML models have mainly focused on the physical parameters of solder joints for estimating the fatigue lifetime under different states. [26][27][28][29] To be specific, the models collected the input parameters, such as geometry features, thermal load specifications, and physical properties of solder interconnections, and established a ML-based algorithm to predict the fatigue lifetime as the target. Hence, until now there has been no published work characterizing the fatigue microstructure of solder joints through ML-based approaches.…”
Section: Introductionmentioning
confidence: 99%
“…24,25 However, the proposed ML models have mainly focused on the physical parameters of solder joints for estimating the fatigue lifetime under different states. [26][27][28][29] To be specific, the models collected the input parameters, such as geometry features, thermal load specifications, and physical properties of solder interconnections, and established a ML-based algorithm to predict the fatigue lifetime as the target. Hence, until now there has been no published work characterizing the fatigue microstructure of solder joints through ML-based approaches.…”
Section: Introductionmentioning
confidence: 99%
“…Hou et al (2022) proposed a novel meshless model for computing stress evolution induced by electromigration in ultra-large-scale integrated circuits, which eliminates the need for time discretization and grid generation in traditional numerical stress evolution analysis, thereby saving computation time while ensuring satisfactory accuracy. Zippelius et al (2022) investigated the thermal-mechanical fatigue of different Sn-Ag-Cu (SAC) solders by transient thermal analysis (TTA), and predicted their thermal-mechanical fatigue behavior using ANNs. Zeng and Yan (2023) used the backpropagation (BP) neural network algorithm to construct a network model for predicting the fatigue life of micro-scale single crystal copper.…”
Section: Introductionmentioning
confidence: 99%
“…Most electronic failures that occur in devices are because of thermomechanical fatigue, a form of low-cycle fatigue (Vianco, 2017). Thermomechanical failures happen when the solder joints are subjected to thermal changes, because the different materials present have different coefficient of thermal expansions (CTEs) (Zippelius, 2022; Libot, 2018; Yan, 2022). Usually, in a PCBA, a solder joint and its surroundings involve materials such as the PCB, mainly constituted by an FR4 substrate (anisotropic CTE values dependent on PCB type: CTE XY = approximately 13–15 and CTE ZZ = approximately 45–350 ppm/°C), and the pad made of copper (CTE of 17–19 ppm/°C), on which the electronic components (CTE between 1.4–10.9 ppm/°C) are connected by solder (CTE of 17–22 ppm/°C) (Hinojosa, 2019; George, 2018; Multi-cb, 2022; Akbari, 2019).…”
Section: Introductionmentioning
confidence: 99%