1991
DOI: 10.1016/0960-8974(91)90025-8
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Relaxed lattice-mismatched growth of III–V semiconductors

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Cited by 35 publications
(14 citation statements)
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“…Although issues which are analogous to those of GaAs/Si(1 0 0) heteroepitaxy apply to the growth of other III-V compound semiconductors such as indium phosphide (InP) and gallium phosphide (GaP) on Si(1 0 0), most studies use metal-organic vapor phase epitaxy (MOVPE) rather than MBE [9] for the latter materials due to the more established preparation of phosphorus containing materials [10]. Reliable process control and industrial The demand for large-scale production of sophisticated III-V devices such as LEDs, lasers, or multi-junction solar cells increases the desire for an improved heteroepitaxial III-V growth on Si(1 0 0) via MOVPE to benefit from more abundant alternative substrates, larger wafer sizes, improved mechanical properties, etc.…”
Section: Introductionmentioning
confidence: 99%
“…Although issues which are analogous to those of GaAs/Si(1 0 0) heteroepitaxy apply to the growth of other III-V compound semiconductors such as indium phosphide (InP) and gallium phosphide (GaP) on Si(1 0 0), most studies use metal-organic vapor phase epitaxy (MOVPE) rather than MBE [9] for the latter materials due to the more established preparation of phosphorus containing materials [10]. Reliable process control and industrial The demand for large-scale production of sophisticated III-V devices such as LEDs, lasers, or multi-junction solar cells increases the desire for an improved heteroepitaxial III-V growth on Si(1 0 0) via MOVPE to benefit from more abundant alternative substrates, larger wafer sizes, improved mechanical properties, etc.…”
Section: Introductionmentioning
confidence: 99%
“…The growth of GaAs layer directly on the silicon substrate, present 3D mode and poor surface morphology is confronted to the large lattice mismatch (4.1%) and 62% in thermal expansion coefficients [4,5]. High density of dislocations and cracks are observed.…”
Section: Introductionmentioning
confidence: 96%
“…High density of dislocations and cracks are observed. However, the tensile stress between them limit the efficiency of GaAs based optoelectronic and electronic devices and their life duration [4]. Since the quality of a buffer layer is important for subsequent growth of a device layer, the research of alternative efficient buffer layer to improve the quality of GaAs layer on Si constitutes an idea in development.…”
Section: Introductionmentioning
confidence: 99%
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“…The growth of GaAs on Si allows the integration of GaAs devices with the Si technology [1][2]. However, the 4.1% large lattice mismatch results in a high defect density in the epilayer which alters the physical properties of the epilayer and the devices made of it.…”
mentioning
confidence: 99%