2001
DOI: 10.1109/77.919816
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Relationship between the surface resistance and crystal orientation of YBa/sub 2/Cu/sub 3/O/sub 7-δ/ thin film

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Cited by 12 publications
(11 citation statements)
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“…While the microwave surface resistance (R S ) of YBa 2 Cu 3 O 7−δ (YBCO) films already appears low enough to meet the minimum requirements for microwave transceivers [1], lower R S can still have a dramatic effect on device performance. Therefore, studies to reduce the R S , to improve its power dependence, as well as to clarify the factors that influence the R S of YBCO are still in progress [2][3][4][5][6][7]. There have been reports that disorder [2], defects [3] and outgrowths [4] in the YBCO films are some of the factors that affect the R S .…”
Section: Introductionmentioning
confidence: 99%
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“…While the microwave surface resistance (R S ) of YBa 2 Cu 3 O 7−δ (YBCO) films already appears low enough to meet the minimum requirements for microwave transceivers [1], lower R S can still have a dramatic effect on device performance. Therefore, studies to reduce the R S , to improve its power dependence, as well as to clarify the factors that influence the R S of YBCO are still in progress [2][3][4][5][6][7]. There have been reports that disorder [2], defects [3] and outgrowths [4] in the YBCO films are some of the factors that affect the R S .…”
Section: Introductionmentioning
confidence: 99%
“…There are also many reports that describe relations between the R S of YBCO films and their crystal structures [5][6][7]. Char et al [5] and Ohshima et al [6] have reported that in-plane orientations of YBCO films could affect their R S values significantly.…”
Section: Introductionmentioning
confidence: 99%
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“…The microwave losses and the power dependence of the surface impedance are expected to be small in LPE films optimized for microwave properties because of small number of grains and grain boundaries [1,7]. A contamination of grain boundaries [6] and a presence of misoriented grains [12] can cause an increase of microwave losses in the sample.…”
Section: Introductionmentioning
confidence: 99%
“…1 shows R eff (T) of a 400nm-thick YBCO film on a 340nm-thick CeO 2 /YSZ/CeO 2 trilayer on textured Ni [41]. While the low normal-state resistance is related to the low impedance of the thin buffer and the metallic substrate, the high R s -level in the superconducting state is attributed to low-and large-angle grain boundaries or microcracks [5,[42][43][44]. These effects add not only to the total surface resistance but lead also to a larger thickness correction due to an enhanced penetration length.…”
mentioning
confidence: 99%