The exchange-coupling mechanism of Cr70Al30/Fe19Ni81 bilayer films was investigated in terms of the crystallographic orientation, the interface roughness, and the grain size. The exchange-coupling field Hex appears when the Cr70Al30 layer is thick enough to accommodate an antiferromagnetic domain wall. The value of Hex was found to increase with decreasing the grain size in association with the [110] orientation. This tendency can be explained by considering the exchange-coupling field evaluated from the random field approximation.