Relation between plasmons and ion-induced damaging in cellulosic derivatives

Jussiaux–Devilder, C.; Moliton, Jean-Pierre; Lazzaroni, Roberto; Brédas, Jean‐Luc; Kihn, Y.; Sévely, J.

doi:10.1002/(sici)1099-0488(19980130)36:2<319::aid-polb10>3.0.co;2-k

Cited by 7 publications

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“…The resulting removal of matter induces the shrinkage effect, that is to say the etching by dry process. Of course, all these phenomena, which are characteristic of organic compounds and does not occur in minerals, depend on the ion fluence, on the ion fluence rate, and on the ion beam energy 22–24. They have been studied for classical values of these parameters in the cited references.…”

Section: Methodsmentioning

confidence: 99%

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Focused ion beam micromachining and computation of polymeric photonic band gap

Pialat

Trigaud²,

Moliton³

et al. 2007

J Polym Sci B Polym Phys

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This article introduces a new approach to the achievement of low cost devices for optical telecommunications. For this purpose, the implementation of polymer components and of the WDM method show several advantages. A polymeric photonic band gap lattice can effectively assume demultiplexing at the wavelength of 1.55 μm without energy dissipation. First, the computation of the geometrical parameters designing a polymer photonic crystal by means of the finite‐difference‐time‐domain method, implemented with Bloch functions, is presented here. Second, the achievement of 2D polymer lattices by a dry process, the focused ion beam milling, is exposed. The experimental conditions for the achievement of a master are discussed on the basis of the milling performances and of the polymers physical properties. © 2007 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 45: 2993–3002, 2007

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Section: Methodsmentioning

confidence: 99%

“…The sweep of the polymer film by the FIB has to be finely adjusted not only according to the considered polymer, but also according to the pattern design, to the film thickness and to the substratum nature 24, 25. So, each physical structure laid down by the device process implies new values for the etching parameters adjustment.…”

Section: Methodsmentioning

confidence: 99%

Focused ion beam micromachining and computation of polymeric photonic band gap

Pialat

Trigaud²,

Moliton³

et al. 2007

J Polym Sci B Polym Phys

Self Cite

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“…This selectivity has been explained on the basis of the Brandt^Richtie model, and some consequences pertaining to the characteristics of the valence band structure have been deduced with a view to electronic applications. 573…”

Section: Radiolysis By Fast Heavy Ions or Protonsmentioning

confidence: 99%

7 Radiation chemistry

Belloni

Delcourt

Houée-Levin⊥

et al. 2000

Annu. Rep. Prog. Chem., Sect. C

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We try in this review to survey advances in all the aspects of Radiation Chemistry (the effects of high energy or ionizing radiation), both basic and applied, made during the period 1995^1999, after the last report issued at the end of 1994. 1 Classically, two main classes of studies are relevant. The ¢rst one includes the primary phenomena induced by the interaction of high-energy radiation with a chemical system. The way the energy is spatially deposited is indeed highly nonhomogeneous and depends on the type of radiation considered. Mutual reactions between the primary species produced also depend on their initial spatial distribution, and therefore on the energy absorption pattern. The kinetic aspects derive directly from the initial events following radiation absorption and thus, when observed at times as short as possible, give useful information on the early energy distribution for each of the radiation types, X-and g-photons, electrons and heavy particles, and, on the in£uence of their intensity and energy per particle.The second class of studies utilizes the background knowledge of radiation chemistry to generate and then to observe the fate of chemical transient species known to be involved in very important chemical or biochemical processes. Numerous data, such as the nature of reaction products, the absolute rate constants, the sequence of elementary reactions constituting a mechanism, and the thermodynamic and spectroscopic properties of short-lived species have been attained. This kind of study of transients and reaction mechanisms, which can be approached only by pulse techniques (essentially pulse radiolysis or laser photolysis, each with its speci¢c advantages), constitutes the new ¢eld of fast to ultrafast chemistry. It concerns extended domains of physical, organic, inorganic, and bio-chemistry. Moreover, the understanding of mechanisms is quite helpful in suggesting new ways of synthesis or degradation induced by irradiation and is now extensively used in developing various speci¢c processes in applied chemistry. The number of studies on the chemical mechanisms and in applied radiation chemistry constitutes an increased fraction of the total publications in radiation chemistry, which we estimate to be around 4000 over the period considered (almost constant compared to the preceding 5-year

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Focused ion beam irradiation—morphological and chemical evolution in PMMA

Kochumalayil

Meiser

Soldera

et al. 2009

Surface & Interface Analysis

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For poly(methyl methacrylate) (PMMA) as a representative of amorphous thermoplastic polymers, the milling effects, and the chemical changes due to ion bombardment with a focused ion beam (FIB) at normal incidence are studied with scanning force microscopy (SFM), scanning electron microscopy (SEM)/energy dispersive X-ray (EDX), and infrared (IR) spectroscopy for varying conditions of Ga + treatment, including the effect of partial water pressure. Stopping and Range of Ions in Matter (SRIM) simulation results for 30 keV Ga + at normal incidence show that the zone of primary ion-polymer interaction extends ca 100 nm into the PMMA. Accordingly, this interaction region is much wider than the original beam diameter. The width of the region where the recoiled ions interact strongly with the polymer chains is larger. Secondary processes, such as fragment diffusion and phonon transport, are expected to extend even farther into the polymer. SEM and SFM reveal distinct topologies of areas milled without or in presence of water vapour. Water vapour-assisted FIB milling produces more roughness and defects. The infrared attenuated total reflection spectroscopy (IR-ATR) spectra indicate that ion milling in PMMA damages methacrylate side groups in particular. In contrary to metals, an increase in the degree of milling is found when the beam spot overlap parameter increases.

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Relation between plasmons and ion-induced damaging in cellulosic derivatives

Cited by 7 publications

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Focused ion beam micromachining and computation of polymeric photonic band gap

Focused ion beam micromachining and computation of polymeric photonic band gap

7 Radiation chemistry

Focused ion beam irradiation—morphological and chemical evolution in PMMA

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