2005
DOI: 10.1117/12.612547
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Reflectivity function based illumination and sensor planning for industrial inspection

Abstract: In this paper, we will derive a phenomenological model of the bidirectional reflectance distribution function of non-LAMBERTIAN metallic materials typically used in industrial inspection. We will show, how the model can be fitted to measured reflectance values and how the fitted model can be used to determine a suitable illumination position. Together with a given sensor pose, this illumination position can be used to calculate the necessary shutter time, aperture, focus setting and expected gray value to succ… Show more

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Cited by 3 publications
(4 citation statements)
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References 9 publications
(10 reference statements)
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“…They showed how the model can be fitted to measured reflectance values and how the fitted model can be used to determine a suitable illumination position. Together with a given sensor pose, this illumination position can be used to calculate the necessary shutter time, aperture, focus setting, and expected gray value to successfully perform a given inspection task (Ellenrieder et al 2005b).…”
Section: Active Lightingmentioning
confidence: 99%
“…They showed how the model can be fitted to measured reflectance values and how the fitted model can be used to determine a suitable illumination position. Together with a given sensor pose, this illumination position can be used to calculate the necessary shutter time, aperture, focus setting, and expected gray value to successfully perform a given inspection task (Ellenrieder et al 2005b).…”
Section: Active Lightingmentioning
confidence: 99%
“…Most of them either try to optimize the configuration of a single sensor for a given task or try to find a short view plan in order to obtain complete visibility of the entire object, e.g. [4,[18][19][20]22]. However, all surveys focus on different subsets of the entire optimization problem, since the global optimization problem belongs to the group of numerical hard problems and is not trivial.…”
Section: Assistance System For the Inspection Planningmentioning
confidence: 99%
“…Ellenrieder et al [19] presented an approach to find optimal camera positions such that different features on an object are entirely seen by one acquired frame. In the next step, the view-planning process considers not only the visibility of certain areas from various sensor positions, but tries to optimize over further quality criteria, like illumination conditions or the measurement uncertainty that decreases if the same surface is measured from different positions and angles [20][21][22]. Weckenmann et al [23] presented an assistance system for planning fringe projection measurements.…”
Section: Introductionmentioning
confidence: 99%
“…The final, optimal viewpoints are found by minimizing the scalar cost functions. Similarly, the visibility map can be used to find an illumination position [5], from which a desired feature illumination condition, e.g. specular or diffuse reflection, can be observed.…”
Section: Optimal Camera and Illumination Planningmentioning
confidence: 99%