Reducing the cost of circular built-in self-test by selective flip-flop replacement

Sullivan, M.; Stroud, Charles E.

doi:10.1109/autest.1995.522714

Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century'

DOI: 10.1109/autest.1995.522714

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Reducing the cost of circular built-in self-test by selective flip-flop replacement

M. Sullivan

Charles E. Stroud²

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Reducing the cost of circular built-in self-test by selective flip-flop replacement

Cited by 1 publication

References 8 publications

Circular bist testing the digital logic within a high speed serdes

Circular bist testing the digital logic within a high speed serdes

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