Circular bist testing the digital logic within a high speed serdes

Hetherington, G.; Simpson, Richard

doi:10.1109/test.2003.1271111

International Test Conference, 2003. Proceedings. ITC 2003.

DOI: 10.1109/test.2003.1271111

|View full text |Cite

Circular bist testing the digital logic within a high speed serdes

G. Hetherington

Richard Simpson

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Publication Types

Select...

Other5

Relationship

Self Cite0

Independent5

Authors

Journals

Cited by 6 publications

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Circular bist testing the digital logic within a high speed serdes

Cited by 6 publications

References 9 publications

Experiments with ABIST test methodology applied to path delay fault testing

Experiments with ABIST test methodology applied to path delay fault testing

An automated, complete, structural test solution for SERDES

Testing high-speed, large scale implementation of serdes i/os on chips used in throughput computing systems

Contact Info

Product

Resources

About