Reducing switching activity by test slice difference technique for test volume compression

Li, Weilin; Wu, Po-Han; Rau, Jiann-Chyi

doi:10.1109/iscas.2009.5118430

Cited by 2 publications

(2 citation statements)

References 21 publications

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“…Although the CSR is useful for reducing the amount of test data by making a longer run length through using difference test data, it is not practical to use this module in the data compression architecture [33]. This is because the hardware area overhead grows by the length of the scan chain [34]. An additional application is widely used by LFSRs [35], [36] for the linear and broadcast-based test compression schemes.…”

Section: Characteristic Of the Twisted Ring Counter For Reusementioning

confidence: 99%

Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression

Seo

Lee

Kang

2016

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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As technology processes scale up and design complexities grow, system-on-chip (SoC) integration continues to rise rapidly. According to these trends, increasing test data volume is one of the biggest challenges in the testing industry. In this paper, we present a new test data compression method based on reusing a stored set with tri-state coding (TSC). For improving the compression efficiency, a twisted ring counter (TRC) is used to reconfigure twist function. It is useful to reuse previously used data for making next data by using the function of feedback of the ring counter. Moreover, the TSC is used to increase the range information transmission without additional input ports. Experimental results show that this compression method improves a compression ratio and a test time on both ISCAS'89 and large ITC'99 benchmark circuits in most cases compared to the results of the previous work without a heavy burden on the hardware.Index Terms-test data compression, system-on-chip, logic testing, tri-state detection, tri-state input, tri-state coding, automatic test equipment, twisted ring counter 0278-0070 (c) His main research interests include VLSI/SoC design and testing, design for testability, BIST, defect diagnosis, and design for manufacturability.

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Section: Characteristic Of the Twisted Ring Counter For Reusementioning

confidence: 99%

Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression

Seo

Lee

Kang

2016

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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“…This is because a number of changing states occur in the scan flip-flops when the test patterns are loaded and unloaded into the scan chains. Hence, toggling phenomenon transitions to the internal combinational logics and switching activities of these logics increase dramatically [4]. As a result, this problem may degrade scan test quality by causing a structural damage to silicon, bonding wires, or packages [5].…”

Section: Introductionmentioning

confidence: 99%

A scan shifting method based on clock gating of multiple groups for low power scan testing

Seo

Lee

et al. 2015

Sixteenth International Symposium on Quality Electronic Design

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From the advent of very large scale integration (VLSI) design, a larger power consumption of a scan-based testing has been one of the most serious problems. The large number of scan cells lead to excessive switching activities during the scan shifting operations. In this paper, we present a new scan shifting method based on clock gating of multiple groups by reducing toggle rate of the internal combinational logic. This method prevents cumulative transitions caused by shifting operations of the scan cells. In addition, the existing compression schemes can be compatible with the proposed method without modification of decompression architecture. Experimental results on ITC'99 benchmark circuits and industrial circuits show that this shifting method reduces the scan shifting power in all cases. In spite of outperformed power, a burden of the extra logic is not necessary to be contemplated.

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Reducing switching activity by test slice difference technique for test volume compression

Cited by 2 publications

References 21 publications

Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression

Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression

A scan shifting method based on clock gating of multiple groups for low power scan testing

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